Tag Archives: WLR

Webinar: Understanding the Basics of Parallel Wafer Level Reliability

Keithley Instruments, Inc. will host a one-hour webinar about parallel wafer level reliability testing. The free webcast will take place Thursday on January 26, 2012. It will be broadcast twice: 15:00 CET (9:00 AM EST) and 2:00 PM EST. The title of the online seminar is Understanding the Basics of Parallel Wafer Level Reliability. The webinar is ideal for engineers who are new to semiconductor reliability testing, test engineers who need to accelerate WLR testing, and QRA lab managers.

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