AWR Corporation published a new system planning white paper. The AWR white paper outlines the benefits of using a commercial, specialized software program such as Visual System Simulator (VSS) for end-to-end system design, while also embracing legacy approaches with the incorporation of spreadsheet views. The technical paper is available now for AWR.
AWR Corporation published a new white paper, entitled X-parameters and Beyond, AWR’s Support of PHD and Nonlinear Behavioral Models. The white paper provides comprehensive information about rapidly-emerging nonlinear models and measurement systems and how AWR’s Microwave Office high-frequency design software effectively employs them.
Laird Technologies published a white paper about the sources of Electromagnetic Interference (EMI) in automotive systems. The technical paper is titled, Automotive EMI Shielding – Controlling Automotive Electronic Emissions and Susceptibility with Proper EMI Suppression Methods. The white paper discusses various electronic systems found on automobiles, and the need of containing and suppressing their EMI potential with each other through EMI shielding and ferrite solutions.
McObject recently published a white paper, “Will the Real IMDS Please Stand Up?” The technical explains how to tell the difference between real and imitation in-memory database systems, and explains why it matters. The free report helps developers determine if they will obtain the IMDS benefits of fast performance and superior database efficiency from specific vendors and products often described as (or purporting to be) in memory database systems.
When simulating a complete subsystem (such as a wireless communication device or radar receiver), the quality of measurement data becomes essential to ensure that the finished product meets or exceeds the demands the system will encounter in service. The measurement data can be used to make changes to the system early in the design process, when those changes can be realized in the least amount of time and at the lowest cost. However, this can be accomplished only if there is a direct link between the system being simulated and the measurement equipment itself.