Tag Archives: testing

XJTAG v2.5 Includes Free Layout Viewer

XJTAG version 2.5 features a free layout viewer. The XJTAG Layout Viewer works in conjunction with XJDeveloper and XJRunner. XJDeveloper enables engineers to quickly and easily set up and run tests on a circuit and create and customize tests to their requirements. XJRunner is a specialized run-time environment for testing. It includes a range of features that are useful for engineers in debugging, testing and doing repair work.

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AdaCore GNATemulator Tool for Embedded Software Testing

AdaCore launched GNATemulator emulator solution for testing embedded software applications. GNATemulator enables software developers to compile code directly for their target architecture and run it on their host platform. The tool translates the target object code to native instructions on the host. GNATemulator is based on the QEMU technology, which is a generic and open source machine emulator and virtualizer. The AdaCore emulator is a streamlined, low-cost alternative to time-accurate target board simulators. GNATemulator is available now.

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QA&TEST Conference Issues Call for Papers

QA&TEST has issued a call for papers. The deadline to submit a paper is March 25, 2011. Papers can be sent in English or Spanish. Simultaneous interpretation services will be provided during the conference. Embedded systems QA and test engineers can submit two types of papers:

  • Tutorials: insight into technologies, tools, instruments and working methods, showing clearly and concisely the practical elements of their implementation
  • Track Presentations: topics of QA and testing for embedded systems and best practices in the QA and testing field

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Sage SmartProbe for AMD Embedded Solutions

The Sage SmartProbe, from Sage Electronic Engineering, provides software engineers a hardware interface to evaluate the system under development at every stage in the design cycle. The tool enables graphic visualization of the entire embedded system operation, including code flow, register access, memory movement, multi-core execution, and peripheral access. SmartProbe can also help speed the qualification process for test and production teams. SmartProbe was designed by Sage Electronic Engineering for AMD Embedded Solutions.

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Corelis Runner-Lite JTAG Test Executive

Corelis introduced Runner-Lite, which is a free software test executive for performing boundary-scan testing, JTAG Embedded Testing (JET), and in-system device programming using pre-generated test plan files built for specific reference boards. Runner-Lite features unrestricted access to complete off-the-shelf JTAG structural and functional test solutions for many silicon vendor reference designs. The tool enables engineers to familiarize themselves with Corelis test capabilities and can be use as a test bench for reference board based designs.

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EB Assist ADTF Tool for Driver Assistance Development

EB (Elektrobit) introduced EB Assist ADTF (Automotive Data and Time-Triggered Framework) modular development framework. EB Assist ADTF accelerates the software development process of driver assistance systems. EB Assist ADTF enables the synchronous collection of relevant sensor data and bus signals (LIN, CAN, FlexRay, MOST), and can replay them in real time. As a result, software functions can be evaluated and validated in near-real time. EB Assist ADTF can display results both in the vehicle and in the laboratory.

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Pentek RTS 2711 Real-Time Data Recording Instrument

The Pentek RTS 2711 Real-Time Data Recording Instrument is a PC-based recorder. It includes a complete PC workstation running Windows XP, housed in a rack-mount 4U chassis. The Pentek RTS 2711 offers simultaneous digitizing and recording of two signals at sampling rates of 500 Megasamples/sec. The price of the RTS 2711 starts at $58,995 USD. It is ideal for development and field testing in a broad range of wideband signal applications including UAVs, telemetry, communication and radar.

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DebugLive Online Debugging Environment

DebugLive is a Web-based environment for debugging Windows application code and production applications. DebugLive complements existing tools with online debugging, problem-solving, collaboration, and remote debugging capabilities via a Web-based service (SaaS). DebugLive allows support and application engineers to jointly debug an application and share resources (dumps, screenshot, messages, etc) in a “virtual room” in real time.

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NI Measurement Suite for Mobile WiMAX

The NI Measurement Suite for Mobile WiMAX (IEEE 802.16e-2005) is a software suite that engineers can use with modular RF instrumentation for automated testing of Mobile WiMAX devices. With NI Measurement Suite, engineers can perform Mobile WiMAX component and device testing faster than with traditional instruments, and with better accuracy and greater flexibility. NI Measurement Suite for Mobile WiMAX is priced from $5,999 (euro 5,499; 882,000 yen).

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Agilent Test Procedures for Serial ATA Revision 3.0

Agilent Technologies released the test procedures for physical and protocol-layer device testing according to the Serial ATA International Organization: Serial ATA (SATA) Revision 3.0 standard. The SATA Revision 3.0 standard defines a maximum transfer speed of 6.0 Gb/s, which is double the speed of previous-generation technology. Faster transfer speeds enable higher-performance storage for applications such as emerging solid-state drives and enterprise business storage. This new specification will enable users to move large quantities of data at faster rates, which is increasingly critical for today’s high-resolution photos, videos, music, and multimedia files.

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