Tag Archives: testing

Coverity Launches Development Testing Platform v6.5

Coverity launched version 6.5 of their Development Testing Platform, which is an integrated suite of software testing technologies for identifying and remediating critical quality and security issues during development. The latest version features Coverity Test Advisor for change impact analysis and unit testing on high risk code, including changed code and code impacted by a change, alerting developers of code not covered by unit tests. Coverity Development Testing Platform 6.5 is available now.

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Synopsys Introduces Virtualizer Development Kits for Renesas Microcontrollers

Synopsys and Renesas teamed together to developed Virtualizer Development Kits. The VDKs for Renesas’ RH850 MCUs are software development tools that integrating functional models of digital hardware. The VDKs help engineers speed software development and system testing for Renesas RH850-based designs. The new VDKs for Renesas’ RH850 MCUs will be available from Synopsys in the fourth quarter of this year.

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SynaptiCAD V2V Translators Feature Verilog 2001 Support, Graphical Debugger

SynaptiCAD rolled out a new version of their V2V translator software. The SynaptiCAD V2V tools translate between VHDL and Verilog source code that supports Verilog 2001 code constructs. SynaptiCAD also announced that their BugHunter Pro can now be used as a graphical debugging environment for translating and testing the new models.

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ASSET InterTech Debuts Board Bring-up Solution for Intel Haswell Microarchitecture

ASSET InterTech announced new tools to structurally verify, functionally test, analyze performance margins and debug boards based on the Intel microarchitecture codenamed Haswell. ScanWorks board bring-up will be available in the second quarter of this year. Pricing for a base level ScanWorks platform for embedded instruments starts at $12,000.

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Rigol Technologies Introduces DSA815 Spectrum Analyzer

Rigol Technologies DSA815 spectrum analyzer

Rigol Technologies launched their DSA815 spectrum analyzer. The DSA815 features all-digital IF technology, highly precise amplitude readings, frequency range of 9kHz to 1.5 GHz, compact design and easy-to-use interface. The DSA815 is easy to use and highly reliable. The Rigol DSA815 spectrum analyzer is available now. Prices start at $1,295. It is ideal for demanding benchtop or field applications in RF and wireless testing and production.

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Analog Devices, Digilent Introduce Analog Design Kits

Analog Devices and Digilent introduced two all-in-one analog design kits: Digilent Analog Discovery Design Kit and Digilent Analog Explorer Design Kit. The two kits help engineering students build and test a wide range of analog and digital circuits using their own PC without the need for any other equipment. The Digilent Analog Discovery Design Kit will be available in June for $99. The more advanced Digilent Analog Explorer Design Kit will be available in August for $199.

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XJTAG Introduces XJQuad Four-port JTAG Adaptor

XJTAG introduced their XJQuad multiport JTAG testing solution. XJQuad is a cost-effective four-port JTAG adaptor targeted at manufacturers. It uses a single USB 2.0 port on a PC to provide high speed JTAG access and can simultaneous test four circuit boards, each of which can be provided with up to four JTAG Test Access Ports. XJQuad enables engineers to test boards together in batches, or to run the four ports independently. XJQuad is ideal for connection testing, in-system programming, non-JTAG device testing, and serial number handling.

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Webinar: Understanding the Basics of Parallel Wafer Level Reliability

Keithley Instruments, Inc. will host a one-hour webinar about parallel wafer level reliability testing. The free webcast will take place Thursday on January 26, 2012. It will be broadcast twice: 15:00 CET (9:00 AM EST) and 2:00 PM EST. The title of the online seminar is Understanding the Basics of Parallel Wafer Level Reliability. The webinar is ideal for engineers who are new to semiconductor reliability testing, test engineers who need to accelerate WLR testing, and QRA lab managers.

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Corelis ScanExpress JET with AMD Embedded Processors Support

Corelis ScanExpress JET now supports AMD embedded processors. ScanExpress JET is a tool for automated at-speed, non-intrusive functional testing. The JTAG Embedded Test (JET) method extends boundary-scan structural test coverage to virtually every signal that is accessible by the on-board CPU(s). Supported AMD processor families include Turion II Neo, Athlon II Neo, Opteron 4100, and Opteron Quad-Core (socket Fr5).

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PLS Universal Debug Engine 3.0.7 Supports NXP LPC4300

PLS Programmierbare Logik & Systeme recently announced version 3.0.7 of their Universal Debug Engine (UDE). UDE 3.0.7 features optimized test and debug functions for the NXP LPC4300 dual-core system-on-chip (SoC) family and offers unlimited dual-core debugging under a single user interface. The LPC4300 features an asymmetrical dual-core digital signal controller (DSC) architecture and two processors (ARM Cortex-M4 and Cortex-M0). The two processors operate with their own clock supply and their own power management, but the communication takes place via a shared memory.

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