Tag Archives: test

National Instruments Acquires AWR for $58 Million

National Instruments is acquiring AWR for about $58 million, which includes $7 million in cash. The existing AWR management team will continue to lead the company in their current roles, and AWR will operate as a wholly owned NI subsidiary developing and selling RF design software. AWR is a supplier of electronic design automation (EDA) software for designing RF and high-frequency components and systems for the semiconductor, aerospace and defense, communications and test equipment industries.

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Tektronix DPO7000C and 4-, 6- and 8-GHz MSO/DPO/DSA70000C Oscilloscopes

Tektronix introduced the DPO7000C Series and new 4-, 6- and 8-GHz models of the MSO/DPO/DSA70000C Series of oscilloscopes. The new Tek oscilloscopes help speed debug efforts of serial buses found in many embedded system designs. Tektronix is offering expanded support for MIPI testing with new serial decode solutions for MIPI Alliance’s CSI-2 and DSI specifications. MIPI Alliance specifications feature higher bit rates, and help smartphone manufacturers reduce time-to-market and device integration costs.

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Corelis ScanExpress Boundary-Scan Tool Suite, Version 7.5

Corelis introduced version 7.5 of their ScanExpress Boundary-Scan Tool Suite. The latest version features automatic identification and classification of resistors and capacitors involved in IEEE-1149.6 high speed, AC-coupled, and differential circuits. ScanExpress TPG v7.5 accelerates IEEE-1149.6 test development. The Corelis tool is available now for engineers with a valid maintenance contract.

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Mentor Graphics Emulation Platform for 100-Gigabit Ethernet

Mentor Graphics introduced their next-generation platform to accelerate the verification of 100-Gigabit Ethernet products. The platform features the Veloce family of emulation products and the iSolve Ethernet Switch solution. The Mentor platform enables network equipment designers to test complete systems, including software and hardware, and employ real-world network traffic early in the development cycle. The solution is available now for deployment.

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2011 Design, Automation & Test in Europe (DATE) Conference

The Design, Automation & Test in Europe Conference features technical presentations, tutorials, panel discussions and user testimonials. DATE 2011 event includes dedicated areas for system level design, hardware design/electronic design automation, robust design and yield, and working silicon hardware prototypes and applications. The DATE 2011 Conference and Exhibition will take place March 14-18th in Grenoble, France.

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NI TestStand 2010 Development System

National Instruments launched the NI TestStand 2010, which is a test management software for automated validation and production testing. The NI TestStand 2010 Development System is priced at $3,899 (euro 4,099; 546,000 yen). NI TestStand helps test engineers build a software framework for accelerating the development of test sequences and minimizes the total cost of ownership of maintaining test executive software deployed across many test stations. New features include a Sequence Analyzer, a three-way file diff-and-merge utility, support for new PC technologies and enhanced integration with NI LabVIEW graphical system design software.

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Corelis TestGenie Boundary-Scan JTAG Test Solution

Corelis introduced the TestGenie low-cost, low-risk boundary-scan JTAG test solution. TestGenie is ideal for engineers with restricted resources, limited JTAG experience, fixed schedules, and tight test budgets. The service-oriented product TestGenie provides designers with a boundary-scan test procedure along with a production-ready execution station. TestGenie is designed for boundary-scan testing and reduces the inherent risks involved with boundary-scan employment. TestGenie allows engineers to use full-featured versions of Corelis ScanExpress products at a fraction of the cost.

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Mentor Graphics SystemVision SVX Client for NI LabVIEW

The Mentor Graphics SystemVision SVX Client environment for the NI LabVIEW software enables designers to develop test bench against a virtual prototype based upon product’s specifications, and then use the exact same test bench in the NI LabVIEW software on physical prototypes. As a result, test bench development to be done in parallel with system development and prototyping. The combination of SystemVision SVX with LabVIEW provides for continuous product test program development much earlier in the development cycle.

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NI WLAN Measurement Suite 2.0 for IEEE 802.11a/b/g/n WLAN Testing

National Instruments announced the NI WLAN Measurement Suite 2.0 for IEEE 802.11n wireless LAN (WLAN) testing. The NI WLAN Measurement Suite 2.0 includes enhanced software toolkits for IEEE 802.11n WLAN signal generation and analysis. The suite integrates with NI 6.6 GHz PXI Express multichannel RF signal generators and analyzers to deliver true, phase-coherent multiple-input, multiple-output (MIMO) RF measurements required for IEEE 802.11n WLAN testing. The NI WLAN Measurement Suite for IEEE 802.11a/b/g/n is priced at $5,999 (euro 5,499; 840,000 yen).

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2010 Automated Test Outlook Report

The Automated Test Outlook, from National Instruments, is a comprehensive view of key technologies and methodologies impacting the test and measurement industry. In the report, NI shares their research into innovations and technologies shaping today’s test and measurement applications. National Instruments structured the Automated Test Outlook report into five categories. In each of the categories, NI highlight a major trend that they believe will significantly influence automated test in the coming one to three years.

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