Tag Archives: Test Algorithms

Synopsys Debuts DesignWare STAR Memory System for 20nm Designs

Synopsys DesignWare STAR Memory System

Synopsys introduced the latest version of their DesignWare STAR Memory System. The tool is an automated pre- and post-silicon memory test, debug, diagnostic and repair solution. The DesignWare Star Memory System enables designers to improve quality of results (QoR), reduce design time, lower test costs and optimize manufacturing yield. The EDA tool is available now.

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