Tag Archives: Tessent

ARM and Mentor Graphics Test Flow for ARM-based Designs

Mentor Graphics and ARM teamed together on a reference flow for manufacturing test of ARM processor-based designs. The reference flow features documentation, seamless interfaces, and scripts for accelerating the development of a complete test solution for ARM IP based on the Mentor Graphics Tessent test tools. The test flow is optimized for high test quality, lower test cost and shortened design-for-test development schedules.

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Mentor Graphics Tessent YieldInsight Yield Analysis Solution

Mentor Graphics launched the Tessent YieldInsight yield analysis solution for manufacturers of advanced digital integrated circuits (ICs). Tessent YieldInsight statistically analyzes large volumes of production test failure diagnosis data produced by the Mentor Graphics Tessent Diagnosis tool (formerly called YieldAssist). the tool helps manufacturers recognize, locate, and fix design- and process-related yield problems to improve IC manufacturing quality levels. Tessent YieldInsight and Tessent Diagnosis are available now.

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