Tag Archives: Spectral-Selective

MAZeT Simulation Tool for Spectral Selective Semiconductor Sensors

MAZeT announced a new tool for the simulation of compact spectral-selective semiconductor sensors for precise inline measurements. The simulation software helps engineers select the right sensor and optimal combination of filters and illumination. The simulation tool is ideal for validating the requirements of new and existing applications. Some optimizations that are highlighted can be easily implemented, for example, swapping the sensor lighting used or choosing objects for calibration.

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