Tag Archives: Sensors

Seminar: Acquiring and Analyzing Data from Sensors and In-Vehicle Networks

SAE International is offering a seminar titled: Acquiring and Analyzing Data from Sensors and In-Vehicle Networks. The SAE seminar will review the traditional approach of acquiring data directly from sensors and cover the newer approach of obtaining data from the in-vehicle network for automotive, heavy duty, off-road, and marine applications. The event will take place November 6-7, 2013 (8:30 am – 4:30 pm) in Troy, Michigan.

Continue reading

Synopsys Introduces DesignWare Sensor IP Subsystem

Synopsys DesignWare Sensor IP Subsystem

Synopsys introduced their DesignWare Sensor IP Subsystem, which is a complete and integrated hardware and software solution for sensor control applications. The DesignWare Sensor IP Subsystem reduces integration effort and cost. The Synopsys DesignWare Sensor IP Subsystem is expected to be available in October of this year to early adopters. General availability is planned for the fourth quarter of 2013.

Continue reading

Altium Debuts Component Libraries for Maxim Integrated Board-Level Design

Altium announced new component libraries for board-level designs using Maxim Integrated devices. The new releases include board-level component models and corresponding supply chain information, such as real-time price and availability data from distributors and vendors including Digi-Key, Mouser and Farnell, directly to designers using Altium’s electronics design software, Altium Designer.

Continue reading

Acquiring and Analyzing Data from Sensors and In-Vehicle Networks Seminar

HEM Data will be conducting a SAE seminar. The event will focus on the newer approach of obtaining data from the in-vehicle network for automotive, heavy duty, off-road, and marine applications. The title of the seminar is: Acquiring and Analyzing Data from Sensors and In-Vehicle Networks. The SAE seminar will take place May 15-16, 2013 in Troy, Michigan.

Continue reading

National Instruments Announces Measurements Roadshow 2012

The upcoming Measurements Roadshow will feature experts from National Instruments, Honeywell and PCB Piezotronics. The half-day event is free and will take place in sixteen European countries in April and May. The NI Measurements Roadshow will explore techniques for acquiring, analysing and presenting data using PC-based data acquisition systems with real-world sensors. The event is ideal for engineers and scientists.

Continue reading

Acquiring and Analyzing Data from Sensors and In-Vehicle Networks Seminar

HEM Data is offering a Society of Automotive Engineers seminar. The event will compare the traditional way for acquiring data directly from sensors to the newer alternative to acquire data directly from the in-vehicle network (CAN bus). The title of the seminar is: Acquiring and Analyzing Data from Sensors and In-Vehicle Networks. The SAE event will take place November 10-11, 2011 (8:30 am – 4:30 pm) in Troy, Michigan.

Continue reading

Webinar: Sensors and How to Use Them

Analog Devices, Inc. (ADI) is offering a webinar, titled: Fundamentals of Designing with Semiconductors: Sensors and How to Use Them. The online seminar will review the concepts of physical signals and explore why and how they must be changed into analog electrical signals, and how they can be processed for the highest reproduced accuracy. The webcast will take place January 12th at noon EST. The Sensors and How to Use Them webinar will be archived after the webcast takes place.

Continue reading

MAZeT Simulation Tool for Spectral Selective Semiconductor Sensors

MAZeT announced a new tool for the simulation of compact spectral-selective semiconductor sensors for precise inline measurements. The simulation software helps engineers select the right sensor and optimal combination of filters and illumination. The simulation tool is ideal for validating the requirements of new and existing applications. Some optimizations that are highlighted can be easily implemented, for example, swapping the sensor lighting used or choosing objects for calibration.

Continue reading