Tag Archives: RF

AWR Connected for Zuken RF Verification Flow for PCB Design

AWR Connected for Zuken RF Verification Flow for PCB Design

AWR and Zuken launched AWR Connected for Zuken. The RF verification flow provides a pathway from Zuken’s CR-8000 Design Force PCB design software into AWR’s Microwave Office high-frequency simulation software. AWR Connected for Zuken is available now from AWR. CR-8000 Design Force PCB design suite is available from Zuken.

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Agilent ADS 2012 Software Improves Design Efficiency and Productivity

Agilent Technologies Advanced Design System (ADS) 2012

Agilent Technologies recently launched the latest version of their Advanced Design System (ADS). ADS 2012 features new user interface enhancements designed to improve design efficiency and productivity. For example, dockable windows enable designers to quickly access frequently used dialog boxes, such as component information and layer visibility in layout. ADS electronic design automation software is ideal for RF, microwave and high-speed digital applications.

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AWR Design Forum 2012 to Take Place in Japan, Korea and Taiwan

AWR Design Forums (ADF) 2012 will take place in Japan (Friday, July 6th), Korea (Tuesday, July 10th), and Taiwan (Thursday, July 12th). The event is ideal for designers of microwave and RF circuits and systems such as monolithic microwave integrated circuit (MMIC), RF printed circuit board (RF PCB) and LTE communication systems. Attendees will learn about AWR latest products and technologies. They can also network and collaborate with each other on industry issues and trends.

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Rigol Technologies Introduces DSA815 Spectrum Analyzer

Rigol Technologies DSA815 spectrum analyzer

Rigol Technologies launched their DSA815 spectrum analyzer. The DSA815 features all-digital IF technology, highly precise amplitude readings, frequency range of 9kHz to 1.5 GHz, compact design and easy-to-use interface. The DSA815 is easy to use and highly reliable. The Rigol DSA815 spectrum analyzer is available now. Prices start at $1,295. It is ideal for demanding benchtop or field applications in RF and wireless testing and production.

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Application Note: Linking RF Design and Test through AWR Software and LabVIEW

AWR has a new application note that explains how EDA tool integration benefits designers of circuits for 3G and 4G wireless systems. The app note describes the benefits of using AWR’s Microwave Office and Visual System Simulator (VSS) high-frequency design software with National Instruments’ LabVIEW signal processing software and virtual instruments. The title of the paper is Using LabVIEW in the AWR Design Environment To Design Complex Circuits for Wireless Applications.

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R&S FSW Signal and Spectrum Analyzer

Rohde & Schwarz announced the new high-end R&S FSW signal and spectrum analyzer. With the R&S FSW, engineers can view multiple measurement applications and analyze signal interactions. The R&S FSW signal and spectrum analyzer is available in three models with frequency ranges of 2 Hz to 8 GHz, 13 GHz or 26.5 GHz. The signal and spectrum analyzer is ideal for development laboratories in the aerospace, defense and communications industries.

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Webinar: Fundamentals of RF Transmission and the Reception of Digital Signals

Analog Devices is hosting another webcast next week. The webinar is titled, The Fundamentals of RF Transmission and the Reception of Digital Signals. The online event will focus on digital modulation for RF designs. The 60-minute webinar will take place on September 14, 2011 at 12:00 pm EDT. The ADI webcast is ideal for students and engineers new to the field of RF communications, as well as more experienced engineers looking for a refresher on digital modulation.

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2011 Nanometer Circuit Verification Forum

Berkeley Design Automation is hosting a forum, the 2011 Nanometer Circuit Verification Forum. The daylong event will cover data converters, PLLs and timing circuits, high-speed I/O, wireless transceivers, and image sensors. The Nanometer Circuit Verification Forum will feature technical presentations from analog and RF circuit designers from the semiconductor industry, silicon IP companies, and international universities. The event will take place September 22, 2011 in Santa Clara, California.

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LNA Design and Characterization Webinar

AWR and Rohde & Schwarz will host a webinar about low noise amplifier (LNA). The webcast is titled, LNA Design and Characterization Using Modern RF/Microwave Software and Test & Measurement Instruments. The online seminar will feature live video segments demonstrating the use of test instruments performing measurements on a prototype low noise amplifier (LNA). Microwave Office will be used to demonstrate useful practices in the virtual prototyping stage. An actual LNA will be measured using a ZVA (Rohde & Schwarz’s Vector Network Analyzer). The event will take place Tuesday, March 8, 2011 at 9 am PST.

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ADI Interfacing RF Components Webinar Taking Place Today

Analog Devices (ADI) will host a webinar on February 16, 2011, at 12:00 pm EST (archived after the 16th). The Interfacing RF Components webcast will discuss the interfacing of stages within the RF receive and transmit paths and explores harmonics, attenuation, and other challenges that could arise when RF stages are not properly connected. The online event will examine RF (radio frequency) interface design challenges and cover best practices to help engineers get the most out of their RF circuits. The Interfacing RF Components webinar is intended for engineers seeking design and system-level support.

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