Tag Archives: Reliability

Webinar: Understanding the Basics of Parallel Wafer Level Reliability

Keithley Instruments, Inc. will host a one-hour webinar about parallel wafer level reliability testing. The free webcast will take place Thursday on January 26, 2012. It will be broadcast twice: 15:00 CET (9:00 AM EST) and 2:00 PM EST. The title of the online seminar is Understanding the Basics of Parallel Wafer Level Reliability. The webinar is ideal for engineers who are new to semiconductor reliability testing, test engineers who need to accelerate WLR testing, and QRA lab managers.

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2011 International Symposium on Quality Electronic Design

The 2011 International Symposium on Quality Electronic Design (ISQED) features seven keynote speeches, poster sessions, nine tutorials, over 100 technical presentations, and exhibits. The conference will take place March 14-16 at the Hyatt Regency Hotel in Santa Clara, CA. The event is co-located with Sematech’s Design for Reliability Workshop (Stress Management for 3D ICs Using Through Silicon Vias) and the International Electronic Design Education Conference (IEDEC). the ISQED keynote speeches and exhibits are free and open to all.

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