National Instruments will hold their NI Technical Symposium in 24 cities throughout North America from October to December. The symposiums feature hands-on training, new product demonstrations, technology exhibitions from National Instruments Alliance Partners and presentations from NI engineers and industry professionals. Highlights include hardware-in-the-loop and real-time testing methods, RF vector signal analysis techniques, best practices for using NI LabVIEW system design software and tips for optimizing DC measurements for speed and stability. Registration is complimentary and open to the public.
National Instruments is acquiring AWR for about $58 million, which includes $7 million in cash. The existing AWR management team will continue to lead the company in their current roles, and AWR will operate as a wholly owned NI subsidiary developing and selling RF design software. AWR is a supplier of electronic design automation (EDA) software for designing RF and high-frequency components and systems for the semiconductor, aerospace and defense, communications and test equipment industries.
National Instruments UK & Ireland is offering three interactive webcasts for engineers and scientists. The webinars will share tips for creating a prototype and present tools to save money and achieve a faster, high-quality product to market. The online seminars will take December 7-9th. Each webcast is be presented at 10am and 2pm with attendees having the opportunity to interact directly with the presenter and other attendees. The series will also be available for download on demand from mid December.
The 2010 NI Technical Symposium is a series of free, day-long technical forums that highlight National Instruments technology for improving system performance and productivity. The symposium features technical sessions, hands-on tutorials. and product demonstrations. The event will take place from September to December in 27 cities in the United States and Canada. National Instruments Alliance Partners, local field engineering teams, and third-party exhibitors also will be at the event to provide information on embedded design, control and test.
The Mentor Graphics SystemVision SVX Client environment for the NI LabVIEW software enables designers to develop test bench against a virtual prototype based upon product’s specifications, and then use the exact same test bench in the NI LabVIEW software on physical prototypes. As a result, test bench development to be done in parallel with system development and prototyping. The combination of SystemVision SVX with LabVIEW provides for continuous product test program development much earlier in the development cycle.
National Instruments announced the NI WLAN Measurement Suite 2.0 for IEEE 802.11n wireless LAN (WLAN) testing. The NI WLAN Measurement Suite 2.0 includes enhanced software toolkits for IEEE 802.11n WLAN signal generation and analysis. The suite integrates with NI 6.6 GHz PXI Express multichannel RF signal generators and analyzers to deliver true, phase-coherent multiple-input, multiple-output (MIMO) RF measurements required for IEEE 802.11n WLAN testing. The NI WLAN Measurement Suite for IEEE 802.11a/b/g/n is priced at $5,999 (euro 5,499; 840,000 yen).
The Automated Test Outlook, from National Instruments, is a comprehensive view of key technologies and methodologies impacting the test and measurement industry. In the report, NI shares their research into innovations and technologies shaping today’s test and measurement applications. National Instruments structured the Automated Test Outlook report into five categories. In each of the categories, NI highlight a major trend that they believe will significantly influence automated test in the coming one to three years.
Measurement Computing Corporation (MCC) introduced MCC DAQ Software CD version 6.0 with 64-bit drivers and ULx (Universal Library Extensions) for National Instruments LabVIEW. The ULx for LabVIEW offers easy-to-use support for LabVIEW (versions 8.2.1 and later). The MCC DAQ Software CD version 6.0 is available for download. It ships with most Measurement Computing hardware products.
National Instruments and Tektronix announced the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar. The event will take place from March 2 through May 18 in 11 cities. The free, half-day technical seminars help engineers increase efficiency in embedded system design processes. The seminars focus on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.
National Instruments launched Measurement Studio 2009 earlier in the week. NI Measurement Studio 2009 decreases development time for engineers using Microsoft Visual Studio 2008, Visual Studio 2005, or Visual Studio .NET 2003 to create test and measurement applications. Measurement Studio 2009 simplifies data acquisition, analysis and visualization by providing integrated I/O support, native libraries and user interface updates. The software introduces support for the latest advancements in PC technologies, including increased memory in 64-bit .NET application development and Microsoft Windows 7 operating systems. Measurement Studio 2009 also provides increased I/O capabilities with integrated support for new NI data acquisition (DAQ) hardware on PC buses such as USB, Ethernet, Wi-Fi, PCI Express and PXI.