National Instruments published their 2013 Automated Test Outlook. The report highlights the latest test and measurement technologies and methodologies. The research examines trends affecting industries such as aerospace and defense, automotive, consumer electronics, semiconductor, telecommunications and transportation.
National Instruments UK and Ireland announce a seven-part Sensor Measurements Fundamentals Webcast Series. The first webinar in the series will cover the essentials of data acquisition and lay the groundwork for subsequent sessions. The rest of the online seminars will focus on specific sensor applications such as temperature, velocity or strain measurements. During each webcast, NI UK and Ireland engineers will present measurement fundamentals, from theory to practice. The first webcast will take place on Tuesday, December 11th.
National Instruments unveiled the NI miniSystems, which are miniaturized versions of real-world systems (such as roll-chassis dynamometers and electrical smart grids). The new lab platforms were developed in collaboration with educational suppliers to bring relevance to math and science theory as students begin to pursue engineering degrees.
National Instruments launched the latest version of TestStand, which is an automated test management software. NI TestStand 2012 helps engineers increase the flexibility and throughput of their automated test systems. The new modular framework makes test setup easier, expands test and reporting flexibility, and makes it possible for engineers to simultaneously test and report during parallel testing.
National Instruments introduced the NI Vision Development Module 2012. The LabVIEW module helps engineers develop and deploy machine vision applications. The Vision Development Module features hundreds of functions for acquiring images from a multitude of cameras and for processing images by enhancing them, checking for presence, locating features, identifying objects, and measuring parts. The cost of the NI Vision Development Module 2012 starts at $3,699 (€3,549; ¥449,000).
The upcoming Measurements Roadshow will feature experts from National Instruments, Honeywell and PCB Piezotronics. The half-day event is free and will take place in sixteen European countries in April and May. The NI Measurements Roadshow will explore techniques for acquiring, analysing and presenting data using PC-based data acquisition systems with real-world sensors. The event is ideal for engineers and scientists.
National Instruments revealed their 2012 Automated Test Outlook, which is based on NI’s latest research on test and measurement technologies and methodologies. National Instruments’ 2012 Automated Test Outlook is based on input from academic and industry research, user forums and surveys, business intelligence and customer advisory board reviews. NI’s report provides information about trends affecting industries like consumer electronics, automotive, semiconductor, aerospace and defense, medical devices and communications.
National Instruments is offering a series of webinars on RF measurements. The webcasts will discuss the fundamentals of making RF measurements and focus on technique, best practices and increasing productivity with the industry’s latest tools. Each of the RF Measurements online seminars will be webcast twice each day, at 10am and 2pm GMT (subtract five hours for eastern standard time). The NI webinars will take place in March. The webcasts will also be available on demand after the series is complete.
Data Translation rolled out version three of their LV-Link virtual instruments library. LV-Link 3.0 VI library enables National Instruments LabVIEW programmers to access the data acquisition features of DT-Open Layers-compliant USB and PCI devices. The software helps engineers to quickly and easily measure and control analog I/O, digital I/O, quadrature decoders, and counter/timer signals, and stream data at full-speed. LV-Link 3.0 is provided free and can be downloaded now.
AWR has a new application note that explains how EDA tool integration benefits designers of circuits for 3G and 4G wireless systems. The app note describes the benefits of using AWR’s Microwave Office and Visual System Simulator (VSS) high-frequency design software with National Instruments’ LabVIEW signal processing software and virtual instruments. The title of the paper is Using LabVIEW in the AWR Design Environment To Design Complex Circuits for Wireless Applications.