Tag Archives: Metrology

Verisurf Software Announces Version 6 of Verisurf X Metrology Software

Verisurf X6 Metrology Software

Verisurf Software rolled out version six of the Verisurf X metrology software. The latest release of Verisurf X includes features that enhance in-process, portable inspection, tool building, CATIA interoperability, and 3D scanning and reverse engineering. Verisurf X6 supports 64-bit Windows 7 and increases productivity for engineers working with very large files.

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Dimension Edge PSS Atomic Force Microscope

Bruker introduced the Dimension Edge PSS Atomic Force Microscope (AFM). The Dimension Edge PSS AFM performs automated measurement, data collection, data analysis and report generation on 2- to 6-inch wafers for production metrology applications. It is designed for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing. The Dimension Edge PSS AFM is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers.

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