Tag Archives: Memory Characterization

Magma SiliconSmart ACE Memory Characterization

Magma Design Automation introduced SiliconSmart ACE Memory Characterization. It features the FineSim Pro simulation technology, dynamic circuit reduction through smart netlist pruning, automatic internal node identification, constraint acceleration, and template-guided function descriptions for vector generation. With SiliconSmart ACE Memory Characterization, integrated circuit (IC) designers can reduce turnaround time and deliver better results for designs targeted at 28-nanometer (nm) and smaller process nodes. SiliconSmart ACE Memory Characterization is an extension to SiliconSmart ACE and is available now.

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