Tag Archives: measurements

Keithley Instruments Debuts Model 2110 Dual-Display Digital Multimeter

Keithley Model 2110 Dual-Display Digital Multimeter front view

Keithley Instruments launched the Model 2110 5½-digit Dual-Display Digital Multimeter. The rugged DMM features 15 measurement functions, seven math functions and dual-line display capability, which allows it to display two different measurements concurrently. The Model 2110 is ideal for production, R&D, and test engineers, scientists, and students making a wide variety of measurements in portable, bench, and system applications.

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National Instruments to Host Sensor Measurements Fundamentals Webcasts

National Instruments Sensor Measurements Fundamentals Webcasts

National Instruments UK and Ireland announce a seven-part Sensor Measurements Fundamentals Webcast Series. The first webinar in the series will cover the essentials of data acquisition and lay the groundwork for subsequent sessions. The rest of the online seminars will focus on specific sensor applications such as temperature, velocity or strain measurements. During each webcast, NI UK and Ireland engineers will present measurement fundamentals, from theory to practice. The first webcast will take place on Tuesday, December 11th.

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How to Make Electrical Resistivity Measurements of Bulk Materials Webinar

Keithley Instruments will host a webinar titled, How to Make Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors. The one-hour webcast will be broadcasted on Thursday, November 18, 2010. The online seminar will present the fundamentals of making resistivity measurements on bulk materials. The web-based event will also cover various resistivity methods and techniques used to achieve optimal results. The online seminar will conclude with an interactive question and answer session. There will be two sessions: Europe: 15:00 CET and North America: 2:00 PM EST.

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MAZeT Simulation Tool for Spectral Selective Semiconductor Sensors

MAZeT announced a new tool for the simulation of compact spectral-selective semiconductor sensors for precise inline measurements. The simulation software helps engineers select the right sensor and optimal combination of filters and illumination. The simulation tool is ideal for validating the requirements of new and existing applications. Some optimizations that are highlighted can be easily implemented, for example, swapping the sensor lighting used or choosing objects for calibration.

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