Tag Archives: measurement

National Instruments Shares Automated Test Outlook for 2012

National Instruments revealed their 2012 Automated Test Outlook, which is based on NI’s latest research on test and measurement technologies and methodologies. National Instruments’ 2012 Automated Test Outlook is based on input from academic and industry research, user forums and surveys, business intelligence and customer advisory board reviews. NI’s report provides information about trends affecting industries like consumer electronics, automotive, semiconductor, aerospace and defense, medical devices and communications.

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R&S FSW Signal and Spectrum Analyzer

Rohde & Schwarz announced the new high-end R&S FSW signal and spectrum analyzer. With the R&S FSW, engineers can view multiple measurement applications and analyze signal interactions. The R&S FSW signal and spectrum analyzer is available in three models with frequency ranges of 2 Hz to 8 GHz, 13 GHz or 26.5 GHz. The signal and spectrum analyzer is ideal for development laboratories in the aerospace, defense and communications industries.

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VIBpoint Precision Measurement System for Sound and Vibration

Data Translation introduced VIBpoint Precision Measurement System for sound and vibration. VIBpoint is a series of vibration measurement products for sound and vibration applications including noise emission monitoring, predictive maintenance, and shock analysis. The series includes both USB and Ethernet (LXI-compliant) hardware options. VIBpoint Precision Measurement System is priced starting at $7,695. Products will ship in 4-6 weeks.

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NI WLAN Measurement Suite 2.0 for IEEE 802.11a/b/g/n WLAN Testing

National Instruments announced the NI WLAN Measurement Suite 2.0 for IEEE 802.11n wireless LAN (WLAN) testing. The NI WLAN Measurement Suite 2.0 includes enhanced software toolkits for IEEE 802.11n WLAN signal generation and analysis. The suite integrates with NI 6.6 GHz PXI Express multichannel RF signal generators and analyzers to deliver true, phase-coherent multiple-input, multiple-output (MIMO) RF measurements required for IEEE 802.11n WLAN testing. The NI WLAN Measurement Suite for IEEE 802.11a/b/g/n is priced at $5,999 (euro 5,499; 840,000 yen).

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PHD and Nonlinear Behavioral Models White Paper

AWR Corporation published a new white paper, entitled X-parameters and Beyond, AWR’s Support of PHD and Nonlinear Behavioral Models. The white paper provides comprehensive information about rapidly-emerging nonlinear models and measurement systems and how AWR’s Microwave Office high-frequency design software effectively employs them.

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2010 Automated Test Outlook Report

The Automated Test Outlook, from National Instruments, is a comprehensive view of key technologies and methodologies impacting the test and measurement industry. In the report, NI shares their research into innovations and technologies shaping today’s test and measurement applications. National Instruments structured the Automated Test Outlook report into five categories. In each of the categories, NI highlight a major trend that they believe will significantly influence automated test in the coming one to three years.

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Tektronix Targets Audio Loudness with Updates for Waveform Monitors

Tektronix announced new new firmware and software upgrades for their WFM6000/7000 and WVR6000/7000 Series of waveform monitors. The upgrades support the ITU-R BS.1770-1/1771 specifications. The new firmware and software upgrades include capabilities such as an Audio Loudness Meter, an Audio Loudness Session Display and the first audio loudness monitoring of Dolby Digital Plus audio.

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2010 Agilent Measurement Forum Asia Tour

The theme of the 2010 Agilent Measurement Forum Asia tour is Powering Collaboration and Innovation in Wireless and Digital Arenas. The Agilent tour will start in Shanghai on April 13, with additional stops in Beijing and Shenzhen, China. Other tour locations include Taiwan (Taipei and HsinChu), South Korea (Seoul), India (Bangalore and New Delhi), Malaysia (Penang), and Singapore.

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Measurement and Analysis Techniques for Embedded System Designers

National Instruments and Tektronix announced the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar. The event will take place from March 2 through May 18 in 11 cities. The free, half-day technical seminars help engineers increase efficiency in embedded system design processes. The seminars focus on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.

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National Instruments Measurement Studio 2009

National Instruments launched Measurement Studio 2009 earlier in the week. NI Measurement Studio 2009 decreases development time for engineers using Microsoft Visual Studio 2008, Visual Studio 2005, or Visual Studio .NET 2003 to create test and measurement applications. Measurement Studio 2009 simplifies data acquisition, analysis and visualization by providing integrated I/O support, native libraries and user interface updates. The software introduces support for the latest advancements in PC technologies, including increased memory in 64-bit .NET application development and Microsoft Windows 7 operating systems. Measurement Studio 2009 also provides increased I/O capabilities with integrated support for new NI data acquisition (DAQ) hardware on PC buses such as USB, Ethernet, Wi-Fi, PCI Express and PXI.

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