Tag Archives: JTAG

Corelis Introduces ScanExpress Boundary-Scan Tool Suite v7.7

Corelis launched version 7.7 of their ScanExpress Boundary-Scan Tool Suite. The latest version of the tool suite features improved constraints handling, support for multi-core devices, and new JTAG Embedded Test support for additional Freescale and Texas Instruments processors. ScanExpress Boundary-Scan Tool Suite, version 7.7 is available now to customers with a valid maintenance contract.

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Corelis Introduces QuadTAP/CFM High-speed Multi-TAP Boundary-scan System

Corelis QuadTAP/CFM four-channel JTAG hardware platform

Corelis introduced their QuadTAP/CFM four-channel JTAG hardware platform. The QuadTAP/CFM seamlessly integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. It is designed for use with Teradyne TestStation and GR228x series testers. The Corelis QuadTAP/CFM platform is a completely seamless and versatile hardware solution that meets multi-TAP JTAG testing requirements on existing Teradyne equipment.

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XJTAG Introduces XJQuad Four-port JTAG Adaptor

XJTAG introduced their XJQuad multiport JTAG testing solution. XJQuad is a cost-effective four-port JTAG adaptor targeted at manufacturers. It uses a single USB 2.0 port on a PC to provide high speed JTAG access and can simultaneous test four circuit boards, each of which can be provided with up to four JTAG Test Access Ports. XJQuad enables engineers to test boards together in batches, or to run the four ports independently. XJQuad is ideal for connection testing, in-system programming, non-JTAG device testing, and serial number handling.

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ASSET InterTech Remote Instrumentation Controller 4000

ASSET InterTech announced the Remote Instrumentation Controller 4000 (RIC-4000) for the ScanWorks platform for embedded instruments. The RIC-4000 can connect over an Ethernet network and apply boundary scan (JTAG) tests on as many as four circuit boards at once. The ASSET InterTech RIC-4000 will be available next month. Prices for the Remote Instrumentation Controller 4000 start at $8,495.

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Corelis ScanExpress JET with AMD Embedded Processors Support

Corelis ScanExpress JET now supports AMD embedded processors. ScanExpress JET is a tool for automated at-speed, non-intrusive functional testing. The JTAG Embedded Test (JET) method extends boundary-scan structural test coverage to virtually every signal that is accessible by the on-board CPU(s). Supported AMD processor families include Turion II Neo, Athlon II Neo, Opteron 4100, and Opteron Quad-Core (socket Fr5).

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ScanWorks Component Action Model-based Test Methodology

ASSET InterTech announced Component Action, which is a new model-based test methodology for the ScanWorks platform for embedded instruments. ScanWorks Component Action extends non-intrusive boundary-scan (JTAG) test coverage to devices that previously could not be tested or programmed with boundary scan. The Component Action models will be available in November as a capability of the ScanWorks platform. Pricing for ScanWorks starts at $5,995.

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ASSET ScanWorks Embedded Diagnostics Solution

ASSET InterTech announced the ScanWorks embedded diagnostics solution, which is the first in-system JTAG-based debugger for Intel x86 platforms. The debugger implements hardware-based run control in system firmware. Once the debugger has been installed, systems can be debugged remotely from anywhere and at anytime with no external JTAG emulator hardware. The ScanWorks embedded diagnostics solution is available now. Pricing is customized based upon platform and BMC configurations.

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Corelis TestGenie Boundary-Scan JTAG Test Solution

Corelis introduced the TestGenie low-cost, low-risk boundary-scan JTAG test solution. TestGenie is ideal for engineers with restricted resources, limited JTAG experience, fixed schedules, and tight test budgets. The service-oriented product TestGenie provides designers with a boundary-scan test procedure along with a production-ready execution station. TestGenie is designed for boundary-scan testing and reduces the inherent risks involved with boundary-scan employment. TestGenie allows engineers to use full-featured versions of Corelis ScanExpress products at a fraction of the cost.

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Corelis Runner-Lite JTAG Test Executive

Corelis introduced Runner-Lite, which is a free software test executive for performing boundary-scan testing, JTAG Embedded Testing (JET), and in-system device programming using pre-generated test plan files built for specific reference boards. Runner-Lite features unrestricted access to complete off-the-shelf JTAG structural and functional test solutions for many silicon vendor reference designs. The tool enables engineers to familiarize themselves with Corelis test capabilities and can be use as a test bench for reference board based designs.

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XJTAG XTR Series Boundary Scan Test System

XJTAG introduced the XJTAG XTR series boundary scan solution. The XJTAG XTR series offers improvements in functionality and usability. The new boundary scan system makies debugging, testing and programming electronic printed circuit boards and systems more efficient. XJTAG XTR features multiple Test Access Ports (TAPs), configurable TAP voltage and voltage measurement, flexible pin mapping and GPIO on pins.

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