Tag Archives: ICT

Corelis Introduces QuadTAP/CFM High-speed Multi-TAP Boundary-scan System

Corelis QuadTAP/CFM four-channel JTAG hardware platform

Corelis introduced their QuadTAP/CFM four-channel JTAG hardware platform. The QuadTAP/CFM seamlessly integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. It is designed for use with Teradyne TestStation and GR228x series testers. The Corelis QuadTAP/CFM platform is a completely seamless and versatile hardware solution that meets multi-TAP JTAG testing requirements on existing Teradyne equipment.

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