Tag Archives: IC-CAP

Agilent IC-CAP WaferPro for Device Modeling

Agilent Technologies introduced IC-CAP WaferPro (Integrated Circuit Characterization and Analysis Program Wafer Professional) software. WaferPro is a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications. IC-CAP WaferPro enables engineers to control semiautomatic and fully automatic probe stations. Agilent WaferPro automates spot and swept measurements across a range of temperatures. WaferPro is distributed with the Agilent IC-CAP 2010.08 software.

Continue reading