Tag Archives: HB-LED

Dimension Edge PSS Atomic Force Microscope

Bruker introduced the Dimension Edge PSS Atomic Force Microscope (AFM). The Dimension Edge PSS AFM performs automated measurement, data collection, data analysis and report generation on 2- to 6-inch wafers for production metrology applications. It is designed for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing. The Dimension Edge PSS AFM is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers.

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