Tag Archives: Forum

2013 Automotive Integrated Electrical Solutions Forum

The Automotive Integrated Electrical Solutions Forum features industry presentations, breakout tracks on specialist topics, a solutions exposition including corporate-sponsored booths, product demonstrations, and networking events. The conference is a day-long, free conference which covers all aspects of electrical and electronic design/simulation within the automotive, commercial vehicle, and off-highway industries. IESF 2013 will take place Thursday, September 19, 2013 at the Ford Conference Center in Dearborn, Michigan.

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Automotive Integrated Electrical Solutions Forum to Take Place Next Month

Mentor Graphics revealed details of the 2012 Integrated Electrical Solutions Forum. IESF 2012 will feature 42 sessions. The conference covers all aspects of electrical and electronic design/simulation within the automotive, commercial vehicle, and off-highway industries. The free, all-day event will take place June 14, 2012 at the Hyatt Regency Hotel, Dearborn, Michigan.

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Fully Depleted Workshop Covers Fully Depleted SOI Technology

The SOI Industry Consortium, CEA-Leti and Soitec are organizing a workshop on fully depleted silicon-on-insulator (FD-SOI) technology for advanced semiconductor architectures. The forum, which includes technical presentations and discussions, will take place in San Francisco, California on February 24, 2012. The event provides semiconductor IC designers and manufacturers with the latest information and insights on using FD-SOI wafers to produce more power efficient ICs at the performance required for applications in mobile and consumer electronics.

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2011 Nanometer Circuit Verification Forum

The 2011 Nanometer Circuit Verification Forum will take place on September 22, 2011 in Santa Clara, California. The nanometer forum will present successful approaches to verifying analog, mixed-signal, and RF circuits implemented in 90nm to 28nm silicon. The all-day event is free, but registration is required. The Nanometer Circuit Verification Forum is hosted by Berkeley Design Automation. Other EDA companies supporting the event include Accelicon Technologies, Ciranova, Invarian, MunEDA, and Solido Design Automation.

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2011 Nanometer Circuit Verification Forum

Berkeley Design Automation is hosting a forum, the 2011 Nanometer Circuit Verification Forum. The daylong event will cover data converters, PLLs and timing circuits, high-speed I/O, wireless transceivers, and image sensors. The Nanometer Circuit Verification Forum will feature technical presentations from analog and RF circuit designers from the semiconductor industry, silicon IP companies, and international universities. The event will take place September 22, 2011 in Santa Clara, California.

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International Conference on Silicon Epitaxy and Heterostructures

International Conference on Silicon Epitaxy and Heterostructures (ICSI) will take place in Leuven, Belgium, from Monday, August 29th to Thursday, September 1st, 2011. Imec, Katholieke Universiteit (KU Leuven), CEA-Leti, and the University of Liege are co-hosting the forum. In addition, Imec will hold a workshop on GeSn with KU Leuven and University of Nagoya, Japan on Friday, September 2nd.

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2011 Common Platform Technology Forum

The 2011 Common Platform Technology Forum will take place at the Santa Clara Convention Center on January 18th. The forum will present technical details of the 28nm HKMG design for low-power applications. The event will also include technology advancements in SoC enablement solutions, materials science, process technology and manufacturing. The Common Platform alliance was formed by IBM, Samsung Electronics and GLOBALFOUNDRIES. The alliance focuses on jointly developed digital CMOS process technologies and advanced manufacturing.

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Electronic Design Automation Interoperability Forum

Synopsys will hold their Electronic Design Automation (EDA) Interoperability Forum in Santa Clara, California on Thursday, October 21, 2010 from 9:30 am to 4:30pm. As you can guess from the name of the event, Forum focuses on the latest developments in EDA interoperability. The forum is ideal for EDA tool developers, IC design and verification engineers, IP providers and members of the press to discuss the industry-critical topics of interoperability and standards. The EDA Interoperability Forum is free and lunch and a light breakfast are included.

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2010 Agilent Measurement Forum Asia Tour

The theme of the 2010 Agilent Measurement Forum Asia tour is Powering Collaboration and Innovation in Wireless and Digital Arenas. The Agilent tour will start in Shanghai on April 13, with additional stops in Beijing and Shenzhen, China. Other tour locations include Taiwan (Taipei and HsinChu), South Korea (Seoul), India (Bangalore and New Delhi), Malaysia (Penang), and Singapore.

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SAME 2010 Forum and SAFA Workshop Issue Call for Papers

The SAME 2010 Forum and the SAFA workshop have issued separate calls for papers. The SAME 2010 Forum provides a venue for discussions and technical knowledge sharing with the opportunity to meet industrials, high-tech companies displaying and demonstrating microelectronic related products. The SAFA’2010 Workshop focuses on techniques around formal analysis.

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