Tag Archives: Diagnostic

Synopsys Debuts DesignWare STAR Memory System for 20nm Designs

Synopsys DesignWare STAR Memory System

Synopsys introduced the latest version of their DesignWare STAR Memory System. The tool is an automated pre- and post-silicon memory test, debug, diagnostic and repair solution. The DesignWare Star Memory System enables designers to improve quality of results (QoR), reduce design time, lower test costs and optimize manufacturing yield. The EDA tool is available now.

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ASSET ScanWorks Supports PLX Technology visionPAK Diagnostic Toolset

ASSET’s ScanWorks platform for embedded instrumentation now supports the PLX visionPAK packet generator/system analyzer toolset. visionPAK provides unique capabilities embedded in PLX PCIe devices helping engineers with board level testing and field debug. ASSET ScanWorks support will enable system manufacturers to use PLX on-board devices to test other components and interconnects of the system more rigorously with lower cost before they get shipped.

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