When simulating a complete subsystem (such as a wireless communication device or radar receiver), the quality of measurement data becomes essential to ensure that the finished product meets or exceeds the demands the system will encounter in service. The measurement data can be used to make changes to the system early in the design process, when those changes can be realized in the least amount of time and at the lowest cost. However, this can be accomplished only if there is a direct link between the system being simulated and the measurement equipment itself.
X-FAB Silicon Foundries announced the XO035 0.35 micrometer process. The XO035 foundry process is optimized for Blu-ray and high-speed optical data communication applications. XO035 includes X-FAB’s blue PIN module. The integration of the PIN diode into the 0.35 micrometer CMOS environment enables the design of high-performance photo detectors. The XO035 process is available now.
Synopsys introduced DesignWare data converter IP solutions for 40-nanometer (nm) process technologies. The IP is targeted at broadband wireless communications, wired communications, and video designs requiring high-performance, ultra-low power consumption and very compact area. The DesignWare Sigma-Delta ADCs, Current Steering DACs, Video DACs, and General Purpose ADCs and DACs in the 40-nm process are expected to be available in Q1 2010. The DesignWare Data Converter IP solutions are currently available in leading foundries and advanced technology processes from 180-nm to 65-nm.