Tag Archives: Characterization

ASSET InterTech Publishes IJTAG Tutorial on New Standard for Chip Validation and Characterization

ASSET InterTech IJTAG Tutorial

ASSET InterTech has published an introductory tutorial on IJTAG. The tutorial explains how the new IEEE P1687 Internal JTAG (IJTAG) standard simplifies and automates the way chip designers manage embedded instruments that perform chip validation and characterization. The article describes the on-chip IJTAG architecture and the two languages defined by the standard, Instrument Connectivity Language (ICL) and Procedural Description Language (PDL). ICL defines the connections among embedded on-chip instruments and PDL is an extension of the Tcl (Tool Command Language) for developing validation, test and debug vectors for execution by IJTAG instruments.

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Mentor Graphics Offers JESD51-14 Compliant Thermal Characterization Solution

Mentor Graphics introduced an integrated solution for thermal characterization and simulation. The integrated solution features their T3Ster hardware test products with their FloTHERM software. The Mentor Graphics integrated T3Ster and FloTHERM solution helps accurate thermal simulation models. The thermal characterization solution is the only JESD51-14 compliant solution available on the market today. The integrated solution for efficient thermal package characterization is available now.

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LNA Design and Characterization Webinar

AWR and Rohde & Schwarz will host a webinar about low noise amplifier (LNA). The webcast is titled, LNA Design and Characterization Using Modern RF/Microwave Software and Test & Measurement Instruments. The online seminar will feature live video segments demonstrating the use of test instruments performing measurements on a prototype low noise amplifier (LNA). Microwave Office will be used to demonstrate useful practices in the virtual prototyping stage. An actual LNA will be measured using a ZVA (Rohde & Schwarz’s Vector Network Analyzer). The event will take place Tuesday, March 8, 2011 at 9 am PST.

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Agilent IC-CAP WaferPro for Device Modeling

Agilent Technologies introduced IC-CAP WaferPro (Integrated Circuit Characterization and Analysis Program Wafer Professional) software. WaferPro is a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications. IC-CAP WaferPro enables engineers to control semiautomatic and fully automatic probe stations. Agilent WaferPro automates spot and swept measurements across a range of temperatures. WaferPro is distributed with the Agilent IC-CAP 2010.08 software.

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Imec and Altos Team on Chip Design and Prototyping Service

Imec and Altos Design Automation will to set up a library re-characterization service based on Altos characterization tools. imec will extend their ASIC (application-specific integrated circuit) prototyping and volume fabrication service with library re-characterization, which is essential when designing in 65nm and 40nm nodes.

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Mentor Graphics FloTHERM IC for Thermal Characterization

Mentor Graphics introduced the FloTHERM IC productivity tool for thermal characterization and design. The FloTHERM IC solution is deployed as a web-based platform that delivers a high level of automation to the design tasks associated with full-spectrum thermal characterization and validation. FloTHERM IC makes it convenient for experts and non-experts to access the technology online, quickly build a model from the libraries and test their performance. As a result, thermal experts can focus on solving difficult semiconductor packaging thermal problems and mission-critical issues instead of fulfilling routine requests.

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Variety MX for Embedded Memories Statistical Timing Model Generator

Variety MX, from Altos Design Automation, is a fast and accurate statistical timing model generator for embedded memories. Variety MX generates instance-specific Liberty models for use by Cadence’s Encounter Timing System GXL, Extreme DA’s Goldtimetm, and Synopsys PrimeTime VX. Variety MX is able to characterize memory sizes that cannot be adequately simulated using brute Monte Carlo methods or even with fast sampling techniques. Variety MX is available now.

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