Tag Archives: 1/f Noise Measurement System

ProPlus Design Solutions Debuts 9812D Wafer-level Noise Measurement System

ProPlus Design Solutions 9812D wafer-level, 1/f noise measurement system

ProPlus Design Solutions introduced the 9812D wafer-level, 1/f noise measurement system. The 9812D features highly accurate measurement, a frequency range that exceeds 10 Megahertz (MHz), built-in dynamic signal analyzer (DSA), and multi-threaded processing. ProPlus Design Systems is accepting orders now for 9812D. The products will start shipping in March.

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