Corelis ScanExpress JET with AMD Embedded Processors Support
Corelis ScanExpress JET now supports AMD embedded processors. ScanExpress JET is a tool for automated at-speed, non-intrusive functional testing. The JTAG Embedded Test (JET) method extends boundary-scan structural test coverage to virtually every signal that is accessible by the on-board CPU(s). Supported AMD processor families include Turion II Neo, Athlon II Neo, Opteron 4100, and [...]
octoFade Software Library for Adding IEEE 802.11n Channel Emulation Logic
octoScope introduced octoFade software, which includes a library that implements IEEE 802.11n standard channel models. The software library enables test equipment manufacturers and integrators to add channel emulation to test instruments used to test MIMO (up to 4×4) or conventional radios. Channel modeling is used for emulating real-life wireless environments in the lab to test [...]
QA&TEST International Conference on Software Testing and Quality Assurance for Embedded Systems
QA&TEST is an international conference on software testing and quality assurance for embedded systems. The event is an active forum for the exchange of experiences and expertise. It is based on real experiences and innovative applications of methods and technologies. The conference is ideal for directors, programme managers, project managers, and testing professionals who work [...]
Corelis ScanExpress Boundary-Scan Tool Suite CD Version 7.6
Corelis rolled out version 7.6 of their ScanExpress Boundary-Scan Tool Suite. The new Version 7.6 CD is the first test tool to include JTAG embedded test (JET) support for AMD Family 10 processors. As a result, ScanExpress v7.6 can perform processor emulation-based testing on AMD ASB2 (BGA), Opteron 4100, and Quad-Core Opteron CPUs. The new [...]
R&S FSW Signal and Spectrum Analyzer
Rohde & Schwarz announced the new high-end R&S FSW signal and spectrum analyzer. With the R&S FSW, engineers can view multiple measurement applications and analyze signal interactions. The R&S FSW signal and spectrum analyzer is available in three models with frequency ranges of 2 Hz to 8 GHz, 13 GHz or 26.5 GHz. The signal [...]
ARM and Mentor Graphics Test Flow for ARM-based Designs
Mentor Graphics and ARM teamed together on a reference flow for manufacturing test of ARM processor-based designs. The reference flow features documentation, seamless interfaces, and scripts for accelerating the development of a complete test solution for ARM IP based on the Mentor Graphics Tessent test tools. The test flow is optimized for high test quality, [...]
ScanWorks Component Action Model-based Test Methodology
ASSET InterTech announced Component Action, which is a new model-based test methodology for the ScanWorks platform for embedded instruments. ScanWorks Component Action extends non-intrusive boundary-scan (JTAG) test coverage to devices that previously could not be tested or programmed with boundary scan. The Component Action models will be available in November as a capability of the [...]
Wind River Test Management 4.0 with Dynamic Instrumentation Technology
Wind River launched version 4.0 of their Wind River Test Management for monitoring, executing and managing embedded device software testing. Wind River Test Management 4.0 enables test coverage at the branch and block level, working directly on optimized production binaries. The full-featured test automation system identifies high-risk segments in production code, enabling optimized testing that [...]
Rigol DS6000 Series Digital Oscilloscopes
Rigol Technologies announced their DS6000 series digital oscilloscopes. The DS6000 features up to 1GHz bandwidth (BW), 1.5GHz bandwidth differential and single-ended active probes. The Rigol DS6000 series oscilloscopes are available in 600 MHz or 1 GHz, 2 or 4 channel varieties. Pricing is dependent upon configurations and quantity. Pricing for the DS6000 series starts at [...]
Piezo Technology in Materials Testing Technote
PI (Physik Instrumente) published an interesting technote about using scanning probe microscopy with piezo stages and capacitive nanometrology sensors to improve nano-indentation and materials testing systems. The NanoTest from Micro Materials is ideal for use with a wide range of materials because it can apply forces of between 30 nN and 500 mN depending on [...]
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