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'Test Solution' Category Archive

ARM and Mentor Graphics Test Flow for ARM-based Designs

Posted by Ken Cheung in Test Solution on Tuesday, September 20, 2011

Mentor Graphics and ARM teamed together on a reference flow for manufacturing test of ARM processor-based designs. The reference flow features documentation, seamless interfaces, and scripts for accelerating the development of a complete test solution for ARM IP based on the Mentor Graphics Tessent test tools. The test flow is optimized for high test quality, [...]

ScanWorks Component Action Model-based Test Methodology

Posted by Ken Cheung in Models, Simulations,Test Solution on Friday, September 9, 2011

ASSET InterTech announced Component Action, which is a new model-based test methodology for the ScanWorks platform for embedded instruments. ScanWorks Component Action extends non-intrusive boundary-scan (JTAG) test coverage to devices that previously could not be tested or programmed with boundary scan. The Component Action models will be available in November as a capability of the [...]

Wind River Test Management 4.0 with Dynamic Instrumentation Technology

Posted by Ken Cheung in Test Solution on Monday, August 22, 2011

Wind River launched version 4.0 of their Wind River Test Management for monitoring, executing and managing embedded device software testing. Wind River Test Management 4.0 enables test coverage at the branch and block level, working directly on optimized production binaries. The full-featured test automation system identifies high-risk segments in production code, enabling optimized testing that [...]

Rigol DS6000 Series Digital Oscilloscopes

Posted by Ken Cheung in Test Solution on Wednesday, August 17, 2011

Rigol Technologies announced their DS6000 series digital oscilloscopes. The DS6000 features up to 1GHz bandwidth (BW), 1.5GHz bandwidth differential and single-ended active probes. The Rigol DS6000 series oscilloscopes are available in 600 MHz or 1 GHz, 2 or 4 channel varieties. Pricing is dependent upon configurations and quantity. Pricing for the DS6000 series starts at [...]

Piezo Technology in Materials Testing Technote

Posted by Ken Cheung in Research,Test Solution on Thursday, June 30, 2011

PI (Physik Instrumente) published an interesting technote about using scanning probe microscopy with piezo stages and capacitive nanometrology sensors to improve nano-indentation and materials testing systems. The NanoTest from Micro Materials is ideal for use with a wide range of materials because it can apply forces of between 30 nN and 500 mN depending on [...]

SEED-XDS560v2 System Trace Emulator

Posted by Ken Cheung in Test Solution on Tuesday, June 28, 2011

The SEED-XDS560v2 System Trace Emulator is a second generation XDS560 emulator. It is fully compatible with Texas Instruments’ XDS560v2 technology. The XDS560 emulator supports real time emulating, debugging and system trace function. The XDS560v2 System Trace Emulator features high speed USB 2.0 (480Mbit/s) and Ethernet RJ45 (10/100M) communication interfaces.

Kontron Machine-to-Machine Smart Services Developer Kit

Posted by Ken Cheung in Test Solution on Wednesday, June 15, 2011

Kontron announced their machine-to-machine (M2M) Smart Services Developer Kit, which was co-developed with Intel. The Kontron M2M kit enables engineers to develop and test application’s connectivity and performance, then quickly deploy. The new M2M Developer Kit houses a COM Express compatible Kontron nanoETXexpress-TT COM (Intel Atom processor E640 1 GHz) and other Kontron M2M System [...]

Mentor Graphics Unified Embedded Software Debugging Platform

Posted by Ken Cheung in Test Solution on Monday, June 6, 2011

Mentor Graphics introduced their unified embedded software debugging platform. The common platform enables embedded software developers to access technology data from hardware design tools without leaving their native embedded software environment. The platform integrates Mentor Embedded Sourcery CodeBench embedded software development tools with Mentor’s electronic system level, verification, and hardware emulation products.

StarVision PRO Integrated Debugging Tool for AMS and Digital Design

Posted by Ken Cheung in Test Solution on Friday, June 3, 2011

Concept Engineering introduced StarVision PRO, which is an integrated debugging cockpit for A/MS and digital design. StarVision PRO makes analysis and debugging of complex SoC and IC designs easy and more transparent. StarVision PRO provides engineers with the ability to quickly and easily understand and debug mixed-mode designs and to integrate IP building blocks into [...]

OnPoint with Failure Triage and Causality Analysis Engines

Posted by Ken Cheung in Test Solution on Wednesday, May 18, 2011

OnPoint, from Vennsa Technologies, now features causality analysis analysis and failure triage engines. The causality analysis engine can determine the root cause of failures at a fine resolution and with high accuracy. The triage engine automatically screens failures and generates an X-ray picture of what is going on in the design and where the error [...]

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