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'Test Solution' Category Archive

Texas Instruments Unveils OMAP5432 Processor-based Evaluation Module

Posted by Ken Cheung in Test Solution on Wednesday, May 22, 2013

Texas Instruments introduced the OMAP5432 processor-based evaluation module. The TI OMAP5432 EVM is a cost-effective tool to prototype software, evaluate applications and benchmark designs. It is available now for $329. The OMAP5432 EVM is ideal for human machine interface (HMI), portable data terminals (PDT), digital signage and medical monitoring end equipment.

Corelis Rolls Out Boundary-Scan Tool Suite v7.8

Posted by Ken Cheung in Test Solution on Tuesday, April 23, 2013

Corelis released a new version of their ScanExpress Boundary-Scan Tool Suite. Version 7.8 of the tool features improved cluster testing support, intelligent BSDL file handling, and a new model-based test coverage. The new version also expands JTAG Embedded Test (JET) support to Texas Instruments AM335x Sitara processors. Current Corelis customers that have a valid maintenance [...]

Blackhawk Launches Scribe I2C Bus Analyzer for Debugging

Posted by Ken Cheung in Test Solution on Tuesday, April 16, 2013

Blackhawk introduced the Scribe I2C bus analyzer. The Blackhawk Scribe is an entry level I2C debugging tool packed with features. The Blackhawk Scribe helps engineers to save development time by providing low level visibility and control of an I2C bus. The Scribe is Blackhawk’s first product introduction outside of their core JTAG emulation-based products. The [...]

VIA Labs, Microsoft Team on SuperMUTT Pack USB Test Tool

Posted by Ken Cheung in Test Solution on Wednesday, April 10, 2013

VIA Labs introduced the SuperMUTT Pack USB test tool. The VIA tool is part of the Microsoft USB Test Tool kit (MUTT) and is an integral part of the Windows Hardware Certification Kit (WHCK). The SuperMuttPack integrates a VIA Labs VL811+ USB 3.0 Hub Controller. It is designed to work with the MUTT family of [...]

Texas Instruments Debuts High Speed Data Converter System Evaluation Kit

Posted by Ken Cheung in Test Solution on Thursday, March 14, 2013

Texas Instruments unveiled the HSCD-SEK-10, which is a complete high-speed data converter system evaluation kit. The HSDC-SEK-10 reduces system evaluation costs and enables designers to get their system running in minutes. The TI high-speed data converter system evaluation kit includes 5 EVM’s for only $799 (costs $945 if purchased separately). The Texas Instruments HSDC-SEK-10 is [...]

ProPlus Design Solutions Debuts 9812D Wafer-level Noise Measurement System

Posted by Ken Cheung in Test Solution on Monday, January 28, 2013

ProPlus Design Solutions introduced the 9812D wafer-level, 1/f noise measurement system. The 9812D features highly accurate measurement, a frequency range that exceeds 10 Megahertz (MHz), built-in dynamic signal analyzer (DSA), and multi-threaded processing. ProPlus Design Systems is accepting orders now for 9812D. The products will start shipping in March.

Keithley Instruments Debuts Model 2110 Dual-Display Digital Multimeter

Posted by Ken Cheung in Test Solution on Monday, January 21, 2013

Keithley Instruments launched the Model 2110 5½-digit Dual-Display Digital Multimeter. The rugged DMM features 15 measurement functions, seven math functions and dual-line display capability, which allows it to display two different measurements concurrently. The Model 2110 is ideal for production, R&D, and test engineers, scientists, and students making a wide variety of measurements in portable, [...]

National Instruments Shares Automated Test Outlook for 2013

Posted by Ken Cheung in Research,Test Solution on Tuesday, January 15, 2013

National Instruments published their 2013 Automated Test Outlook. The report highlights the latest test and measurement technologies and methodologies. The research examines trends affecting industries such as aerospace and defense, automotive, consumer electronics, semiconductor, telecommunications and transportation.

PLS Universal Debug Engine 4.0 Supports Multicore Targets

Posted by Ken Cheung in Test Solution on Monday, January 14, 2013

PLS Programmierbare Logik & Systeme released version four of their Universal Debug Engine (UDE). UDE 4.0 features improved debug capabilities for multicore targets, optimized visualization options during system test and dedicated support for the latest 32-bit multicore System-On-Chips (SOCs). UDE 4.0 now supports microcontrollers (MCUs) for the Infineon AURIX family, Freescale Qorivva MPC57XX family, and [...]

XJTAG 3.0 Boundary Scan Development System

Posted by Ken Cheung in Test Solution on Friday, December 14, 2012

XJTAG released the latest version of their boundary scan development system. Engineers can intuitively learn how to use XJTAG 3.0 without attending lengthy and expensive training courses. The new XJTAG Development System is now available on a 30-day free trial.

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