'Test Solution' Category Archive

Tektronix USB-TX Superspeed USB Test for DPO/DSA70000B Oscilloscope

Posted by Ken Cheung in Test Solution on Tuesday, May 26, 2009

Tektronix introduced the USB-TX option for the DPO/DSA70000B Oscilloscope. USB-TX option is a comprehensive toolset for characterization, debug ,and automated compliance test of Superspeed USB (USB 3.0) devices. The DPO/DSA70000B Oscilloscope with USB-TX delivers an automated, one-button solution to validate USB 3.0 transmitter devices – enabling engineers a more efficient way to bring their designs [...]

Crossware 8051 Development Suite Supports Silicon Labs C8051F7xx MCUs

Posted by Ken Cheung in Test Solution on Wednesday, May 20, 2009

Crossware’s 8051 Development Suite now supports Silicon Laboratories’ C8051F7xx family of high pin-count, touch-sensing microcontrollers. The C8051F7xx support helps developers to rapidly exploit the advanced features of the new chips by providing a combination of wizards, simulation, debugging, compiler extensions, and pre-configuration. The enhancements enable programmers using the C8051F7xx chips to accelerate the development process [...]

ASSET ScanWorks for Intel Xeon Processor 5500 Series

Posted by Ken Cheung in Test Solution on Wednesday, May 6, 2009

ASSET InterTech announced that their ScanWorks platform for embedded instrumentation supports both signal integrity design validation and circuit board test for the Intel Xeon processor 5500 series (codenamed Nehalem) as well as the 5520 chipset. Xeon 5500 series processors will be deployed in systems using Intel’s QuickPath Interconnect (QPI) platform architecture. Pricing for ScanWorks for [...]

ADLINK AD-Logger Configuration-based Data Logger

Posted by Ken Cheung in Test Solution on Tuesday, May 5, 2009

AD-Logger, from ADLINK Technology, is a ready-to-run data capture application that offers a simple configuration-based means to log data. AD-Logger is specifically designed to provide extensive data logging features without the need for complex programming. Users simply configure ADLINK data acquisition or digitizer card functionality via AD-Logger through the use of intuitive and interactive configuration [...]

Free Use of ATS Thermal Characterization Laboratory

Posted by Ken Cheung in Test Solution on Wednesday, April 29, 2009

Advanced Thermal Solutions (ATS) is offering a half-day of free, no-obligation use of their Thermal Characterization Laboratory to engineers who need to perform thermal testing of their heat sinks, fans and fan trays, PCBs, blades, enclosures, or complete systems. Engineers and board and system designers can perform the tests themselves, or consult with an ATS [...]

The MathWorks Vehicle Network Toolbox

Posted by Ken Cheung in Test Solution on Monday, April 20, 2009

Vehicle Network Toolbox, from The MathWorks, directly connects MATLAB to a vehicle’s Controller Area Network (CAN). The tool eliminates the need for additional connectivity tools. Vehicle Network Toolbox is a powerful environment for streamlining test, verification, and analysis activities. Vehicle Network Toolbox is available immediately for the Microsoft Windows platform. U.S. list prices start at [...]

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