Application Note: Multisim/Ultiboard for Low-Frequency Simulation and Layout
AWR published a new application note. The article explains how to complement Microwave Office circuit design software with National Instrument’s Multisim circuit simulation software and Ultiboard printed circuit board (PCB) layout software for a comprehensive design flow spanning from DC to microwave frequencies. The title of the technical paper is Multisim/Ultiboard for Low-Frequency Simulation and [...]
AWR Application Note: Design and Optimization of a Board-to-Chip Transition
AWR published an application note about the features of Analyst EM Simulator for chip-module-board transitions. The technical paper highlights the features of AWR’s 3D finite element method (FEM) EM simulator by demonstrating the optimization of the transition from a board-to-chip signal path. The article shows how the ability to access Analyst seamlessly from within the [...]
White Paper: Understanding and Correctly Predicting Critical Metrics for Wireless RF Links
AWR published a white paper about correctly predicting cellular, radar, or satellite RF link performance early in the design cycle. The article highlights the advantages of using Visual System Simulator (VSS) RF system simulation software for detailed insight into the full performance of an RF link in next-generation wireless products. The title of the technical [...]
National Instruments Shares Automated Test Outlook for 2013
National Instruments published their 2013 Automated Test Outlook. The report highlights the latest test and measurement technologies and methodologies. The research examines trends affecting industries such as aerospace and defense, automotive, consumer electronics, semiconductor, telecommunications and transportation.
Electronic Design Automation Increased by 4.9% in Q3 2012
According to the EDA Consortium (EDAC) Market Statistics Service (MSS), the Electronic Design Automation (EDA) industry revenue increased 4.9% in the third quarter of 2012. Revenues grew to $1619.9 million, compared to $1543.9 million in Q3 2011. Sequential EDA revenue for Q3 2012 increased 1.7% compared to Q2 2012. The four-quarters moving average increased by [...]
New Book: Analog Circuit Design, Volume 2, Immersion in the Black Art of Analog Design
Newnes Press, an imprint of Elsevier, announced the publication of Analog Circuit Design, Volume 2, Immersion in the Black Art of Analog Design. The book is a companion volume to Analog Circuit Design: A Tutorial Guide to Applications and Solutions. The book includes application notes on power management, data conversion and signal conditioning circuit solutions, [...]
ASSET InterTech Publishes IJTAG Tutorial on New Standard for Chip Validation and Characterization
ASSET InterTech has published an introductory tutorial on IJTAG. The tutorial explains how the new IEEE P1687 Internal JTAG (IJTAG) standard simplifies and automates the way chip designers manage embedded instruments that perform chip validation and characterization. The article describes the on-chip IJTAG architecture and the two languages defined by the standard, Instrument Connectivity Language [...]
Cadence Design Systems Publishes Mixed-Signal Methodology Guide
Cadence Design Systems announced a new publication: Mixed-Signal Methodology Guide. The design methodology book provides an overview of the design, verification and implementation methodologies required for advanced mixed-signal designs. The book addresses the complex problems facing the mixed-signal design community. It features mixed-signal design experts from Boeing, Cadence, ClioSoft and Qualcomm. The Mixed-Signal Methodology Guide [...]
National Instruments Reveals Embedded Systems Outlook for 2012
National Instruments shared their 2012 Embedded Systems Outlook report. The report outlines National Instruments’ conclusions about the direction of the embedded systems market. The NI Embedded Systems Outlook lists technology and business-level trends that impact the development of next-generation embedded systems. The report provides information for a range of demanding embedded control and monitoring applications [...]
National Instruments Shares Automated Test Outlook for 2012
National Instruments revealed their 2012 Automated Test Outlook, which is based on NI’s latest research on test and measurement technologies and methodologies. National Instruments’ 2012 Automated Test Outlook is based on input from academic and industry research, user forums and surveys, business intelligence and customer advisory board reviews. NI’s report provides information about trends affecting [...]
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