Acquiring and Analyzing Data from Sensors and In-Vehicle Networks Seminar

HEM Data is offering a Society of Automotive Engineers seminar. The event will compare the traditional way for acquiring data directly from sensors to the newer alternative to acquire data directly from the in-vehicle network (CAN bus). The title of the seminar is: Acquiring and Analyzing Data from Sensors and In-Vehicle Networks. The SAE event will take place November 10-11, 2011 (8:30 am – 4:30 pm) in Troy, Michigan.

SAE Seminar Topics

  • Sensor Inputs: sensor overview, single-ended vs. differential inputs, proper ranging of the channels, zeroing offsets and signal conditioning
  • Data Acquisition: analog-to-digital converters (A/D), time and amplitude resolution, pre- and post-triggering, time synchronous averaging, sample rate, aliasing, frame length and number of frames in a data file
  • Frequency Domain: analyzing data in the frequency domain with the Fast Fourier Transform (FFT) is a valuable tool to optimize sample rate, which affects many factors such as data quality (aliasing), time and frequency resolution, digital filtering, integration and differentiation
  • Comparison of in-vehicle data acquisition with sensor data acquisition
  • Explanation of OBD-II and what it can and cannot do for you
  • Examination of files containing hex message (message files will be shown from both heavy duty and automotive vehicles)
  • Step-by-step procedure to acquire parametric data for both a PC and stand-alone loggers
  • Explanation of why the database relating parameters and messages is the key and how to get this database information
  • Demonstration of acquiring data from both an in-vehicle network and sensors
  • Review of applicable standards and references
  • Identify unknown automotive protocols and learn about the various network protocols
  • Define wireless data acquisition options, the advantages and disadvantages of them and the practical throughput rate for real-time data acquisition
  • How to select the best numerical techniques and how to optimize their performance for digital filtering (including IIR and FIR filters), integration, differentiation, and correlation
  • How combining logic, statistics and Z transform provides a powerful technique to find key points along a waveform to make decisions such as pass/fail or perform intelligent monitoring that only stores the data of interest to optimize data storage and minimize your time required to review the data

More info: HEM Data Society of Automotive Engineers Seminar