Application Note: Linking RF Design and Test through AWR Software and LabVIEW

AWR has a new application note that explains how EDA tool integration benefits designers of circuits for 3G and 4G wireless systems. The app note describes the benefits of using AWR’s Microwave Office and Visual System Simulator (VSS) high-frequency design software with National Instruments’ LabVIEW signal processing software and virtual instruments. The title of the paper is Using LabVIEW in the AWR Design Environment To Design Complex Circuits for Wireless Applications.

Linking RF Design and Test through AWR Software and National Instruments LabVIEW

Not long ago, integration of baseband signal processing, high-frequency, and system-level software tools with either virtual or hardware-based instruments was extremely difficult if it could be accomplished at all. Today, the performance requirements imposed by today’s wireless standards make it a necessity and software tools such as LabVIEW, Microwave Office, VSS and AXIEM, combined with the flexibility of virtual instruments makes this not only possible but straightforward and accurate as well.

When used together, they provide a formidable weapon with which to combat challenges such as maintaining signal linearity over broad bandwidths as well as meeting the requirements of wireless standards such as LTE and WiMAX. These challenges will invariably continue to increase in complexity with the emergence of LTE-Advanced that will follow its predecessor in five years or so, and surely in even more spectrally-efficient communications technologies of the future. When they do, the process described in this application note will be up to the challenge.

More information: ARM TechCon 2011 Registration (pdf)