Keithley Instruments will host a webinar titled, How to Make Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors. The one-hour webcast will be broadcasted on Thursday, November 18, 2010. The online seminar will present the fundamentals of making resistivity measurements on bulk materials. The web-based event will also cover various resistivity methods and techniques used to achieve optimal results. The online seminar will conclude with an interactive question and answer session. There will be two sessions: Europe: 15:00 CET and North America: 2:00 PM EST.
The Electrical Resistivity Measurements webinar is ideal for materials researchers, research labs, physicists, universities, and companies who need to test resistivity of their products (solar cells, plastics, paper, tires, semiconductors, etc). The webcast is free to the public, but participants must register in advance. The online seminar will also be archived on Keithley’s website for those unable to attend the original broadcast. Mary Anne Tupta, a lead applications engineer at Keithley Instruments, will present the seminar.
How to Make Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors
Electrical resistivity is a basic material property and is a very common electrical measurement. Specific resistivity measurement methods are used depending upon the type of material, whether conductor, insulator, or semiconductor. This webinar provides details on the various resistivity methods and techniques used to achieve optimal results.
Participants will learn the fundamentals of making resistivity measurements on bulk materials. The methods vary depending on if the material is a conductor, an insulator, or a semiconductor. Some of the specific methods include making four-wire resistance measurements of metals, volume and surface resistivity measurements of insulators, and four-point collinear probe and van der Pauw measurement methods of semiconductor materials. In addition to discussing these methods, measurements techniques that pertain to the method are also detailed. Some of the many techniques and sources of error discussed include electrostatic interference and shielding, leakage current and guarding, thermoelectric EMFs and offset compensation, and others. Along with using the proper method and techniques, the appropriate instrumentation must also be used to make the desired measurements.