AWR Corporation published a new white paper, entitled X-parameters and Beyond, AWR’s Support of PHD and Nonlinear Behavioral Models. The white paper provides comprehensive information about rapidly-emerging nonlinear models and measurement systems and how AWR’s Microwave Office high-frequency design software effectively employs them.
Graphical representation of harmonic superposition principle utilized by PHD models
White Paper Overview: X-parameters and Beyond, AWR’s Support of PHD and Nonlinear Behavioral Models
Linear and nonlinear device models, the building blocks of most RF and microwave designs, are costly and time-consuming to develop. As most compact model parameters are extracted from linear, 50-ohm S-parameters and DC IV data, their ability to predict behavior under extreme nonlinear conditions or non-50 ohm terminations is unreliable. These issues, along with the fact that model quality varies greatly among device manufacturers, presents a major dilemma for circuit designers. Fortunately, recent developments in measurement and modeling technology are focusing on technology-independent, measurement-based black box models. This white paper is a comprehensive resource about all of these models, the latest developments, and the efforts of the various participating companies.
More info: X-parameters and Beyond White Paper