The Automated Test Outlook, from National Instruments, is a comprehensive view of key technologies and methodologies impacting the test and measurement industry. In the report, NI shares their research into innovations and technologies shaping today’s test and measurement applications. National Instruments structured the Automated Test Outlook report into five categories. In each of the categories, NI highlight a major trend that they believe will significantly influence automated test in the coming one to three years.
The 2010 Automated Test Outlook combines input from academic research, business intelligence, user surveys, online forums, customer advisory board feedback and field sales discussions. The NI 2010 Automated Test Outlook is organized into five categories: Business Strategy, Architectures, Computing, Software and I/O. Within each of the five categories, the report details a trend, methodology or technology impacting test and measurement.
Automated Test Outlook Topics
Developing a common test platform reduces costs and increases reuse throughout the product life cycle
- Multichannel RF Test
Testing next-generation wireless devices requires a highly synchronized parallel test architecture from signal to software
- Peer-to-Peer Computing
Increasingly complex testing requirements require higher performance and point-to-point computing architectures
- Embedded Design and Test
Real-time test software helps engineers reuse tests alongside their embedded system models throughout the development process
- Reconfigurable Instruments
Field-programmable gate array (FPGA)-based instruments deliver a new level of performance and flexibility by facilitating reconfigurability down to the hardware
The business and technology insights presented in the outlook apply across many industries including communications, aerospace and defense, semiconductor, automotive and consumer electronics. The goal of the 2010 Automated Test Outlook is to help engineers and managers gain insight into the cross-industry trends impacting their organizations.
More info: The 2010 Automated Test Outlook