Measurement and Analysis Techniques for Embedded System Designers

National Instruments and Tektronix announced the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar. The event will take place from March 2 through May 18 in 11 cities. The free, half-day technical seminars help engineers increase efficiency in embedded system design processes. The seminars focus on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.

Seminar Topics

  • Streamlined methods for acquiring measurements in USB, SPI and I2C protocols
  • Running power efficiency and other custom analyses to convert data into useful information
  • Visualization of data and generating consistent reports
  • Connecting multiple instruments on the design bench to a host computer or laptop over GPIB, USB, PXI and Ethernet/LXI for optimized instrument control

The sessions will present the knowledge and tools to speed product design life cycles through effective debugging and verification. Attendees can gain insight from experts from National Instruments and Tektronix on how to efficiently test and verify their designs through precise serial bus decode measurements, instrument control, timing and power analysis and report generation. In addition, engineers can learn best practices for scaling development efforts from design to test with hybrid test systems.

Seminar Sessions

  • Automated Control of Measurement Tasks for Consistent Results
    A “connected bench” can provide a workgroup of embedded engineers with access to data and consistent reporting results through the power of the PC and the Internet/local area network (LAN). Learn how to connect your Tektronix instruments for control, logging, and display of acquired measurements using NI LabVIEW and LabVIEW SignalExpress. Discover analysis and visualization techniques you can take back to your lab.

  • Advanced Analysis Tools for Debugging and Verification
    The ability to perform advanced analysis and custom signal processing on acquired signal is key to converting measurements to useful information about your design. Learn about correlating measurements from multiple instruments, developing custom analysis routines, and reusing your math scripts. Using one software tool chain for test debugging, verification, and automation will also be covered.

  • Enhancing Embedded System Testing
    Walk through an embedded design workflow from prototype turn-on to certification test completion and highlight proper test and measurement approaches, which enhance productivity and shorten debugging time. Application test examples covered in this session include switched mode power supply analysis, parallel/serial bus capture and decoding, clock signal integrity testing, and memory bus analysis.

Seminar Dates and Locations

  • Austin, March 2, 2010
  • Dallas, March 4, 2010
  • San Diego, March 23, 2010
  • Santa Clara, March 25, 2010
  • Toronto, April 13, 2010
  • Washington DC, April 20, 2010
  • Newark, April 27, 2010
  • Boston, April 29, 2010
  • Orlando, May 11, 2010
  • Phoenix, May 13, 2010
  • Portland, May 18, 2010

More information: Measurement and Analysis Techniques Seminar