Tektronix USB-TX Superspeed USB Test for DPO/DSA70000B Oscilloscope

Tektronix introduced the USB-TX option for the DPO/DSA70000B Oscilloscope. USB-TX option is a comprehensive toolset for characterization, debug ,and automated compliance test of Superspeed USB (USB 3.0) devices. The DPO/DSA70000B Oscilloscope with USB-TX delivers an automated, one-button solution to validate USB 3.0 transmitter devices – enabling engineers a more efficient way to bring their designs to market. Tek also unveiled a full set of USB 3.0 test fixtures that enable engineers to perform more accurate transmitter, receiver, and cable testing. Test fixtures will be available in the summer 2009.

Other industry offerings provide only normative measurements per the USB-IF electrical test specification. The Tektronix option USB-TX supports all measurements including normative and informative tests – Spread Spectrum Clocking (SSC), Slew, Voltage Levels and others. This enables designers to have full confidence in their design validation process.

Where other available solutions are limited to standard specific compliance, Tektronix USB-TX provides a comprehensive and complete characterization, debug, and compliance toolset. In combination with the only available plug-style test fixture that enables probing as close to the silicon as possible, the Tektronix USB3.0 test solution provides the truest representation of the signal.

Option USB-TX is built on TekExpress framework which has been developed for automated one-button testing of high speed serial data standards. TekExpress modules are based on the test requirements and Methods of Implementation (MOI) specified and published by the standard bodies. All tests procedures are automated and customers simply need to select the desired tests to obtain a comprehensive report with pass/fail and margin results. In addition to the new USB 3.0 offering, automation modules are also currently available for SATA and DisplayPort.

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