Test and Debug cJTAG – IEEE 1149.7 Webinar

IPextreme, Inc. and Texas Instruments Incorporated (TI) (NYSE: TXN) will hold a webinar on the first semiconductor IP solution to implement the new IEEE 1149.7 test and debug standard. The cJTAG – IEEE 1149.7 IP core was developed by TI and packaged and distributed and supported by IPextreme. The webinar, entitled “The Next Generation Test and Debug: cJTAG – IEEE 1149.7,” will cover the new IEEE 1149.7 standard and the robust features available in the cJTAG – IEEE 1149.7 IP core. The webinar will be held on Tuesday, November 11, from 1600hrs to 1700hrs Central European Time (7:00am to 8:00am Pacific Standard Time).

Stephen Lau from TI and Pierre-Xavier Thomas and Rick Tomihiro from IPextreme will cover the new IEEE 1149.7 standard and the robust set of features available in the cJTAG – IEEE 1149.7 IP core. Attendees will learn how the cJTAG – IEEE 1149.7 IP core can be utilized in their next chip design.

cJTAG – IEEE 1149.7 is the first semiconductor IP solution to implement the new IEEE 1149.7 test and debug standard. IEEE 1149.7 does not change or replace IEEE 1149.1; instead, it offers a scalable set of extensions to the IEEE 1149.1. Some of the advantages of the new IEEE 1149.7 standard are that it requires fewer pins and that it adds power management and powerful new debug features while maintaining full compatibility with existing IEEE 1149.1 based hardware and software.

More info: The Next Generation Test and Debug: cJTAG – IEEE 1149.7