Teradyne, Inc. (NYSE:TER) recently announced the D750Ex LCD Driver Test System. The D750Ex is designed for testing high-definition LCD driver devices. The D750Ex is based on the J750 platform, which has more than 2,600 systems installed worldwide. The D750Ex system provides a true high density resource per pin architecture that supports over 97 percent parallel test efficiency of the overall program. The D750Ex also features both an embedded DSP and central DSP architecture to improve processing throughput. Its zero footprint design takes up 50-85 percent less floor space than competitive systems that use both large mainframe cabinets and a test head.
- Lowest Cost of Test
True per pin test architecture provides faster throughput
- Zero footprint tester-in-a-test-head design
requires 50-85% less floor space than competitive systems
- Flexible Multi-Site Development Environment
Any Pin architecture for all channels, dramatically simplifies probe card design
The D750Ex has a Universal Slot architecture, which enables multiple instrument types to be placed in a system depending on the device test needs. A Memory Test Option (MTO) is also available with the D750Ex, requiring no additional slots and can be leveraged to test mobile driver devices in a single pass. On competitive systems, mobile devices must be tested on two platforms, one for LCD and the other for memory. The D750Ex ‘any pin’ architecture for all channels, dramatically simplifies probe card design and allows for a more flexible multi-site test development environment.
More information: Teradyne D750Ex