The new SpyGlass-DFT DSM solution, from Atrenta Inc., is the latest addition to the SpyGlass® design analysis platform. SpyGlass-DFT DSM is the industry’s first tool that accelerates design turnaround times by identifying timing closure issues caused by at-speed testing – early at RTL. The SpyGlass-DFT DSM product was developed in consultation with several Atrenta customers in Europe, India, Japan, Korea and the U.S. The product will be available in SpyGlass version 4.0. The U.S. list price is $75,000 for a one-year time based license.
SpyGlass-DFT DSM features advanced timing closure analysis and RTL testability improvement for deep submicron (DSM) defects associated with at-speed testing. It provides accurate RTL fault coverage estimation for transition delay testing, together with diagnostics for low fault coverage, early in the design flow, to achieve high test quality with minimum design iterations.
SpyGlass-DFT DSM is designed to specifically address the problems associated with timing closure due to at-speed DFT. The test clocks in traditional stuck-at testing are designed to run on test equipment at frequencies lower than the system speed. At-speed testing requires test clocks to be generated at the system speed and these clocks are often shared with functional clocks from a phase locked loop (PLL) clock source. The additional test clocking circuitry affects functional clock skew and thus the timing closure of the design. At-speed tests often result in lower than required fault coverage, even with full-scan and high (>99%) stuck-at coverage. Identifying reasons for low at-speed coverage at the ATPG stage is too late to make changes to the design and affects schedules significantly. SpyGlass-DFT DSM identifies causes of low at-speed coverage at RTL and helps achieve quick turnaround times for today’s aggressive design schedules and time-to-market challenges.
More info: Atrenta