National Instruments Automated Test Summit 2008
National Instruments’ (Nasdaq: NATI) fifth annual Automated Test Summit is an online event that features technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the web on June 5 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibition area.
Representatives from leading test and measurement companies worldwide (such as Averna, Cal-Bay, Intel, Microsoft, and Tektronix) will share their technical expertise and best practices in sessions during the event.
Session Themes
- Reducing software development cost
- The latest trends in hardware design
- Extending the life of your test system
- Test engineering panel discussion
Conference Schedule
- Keynote: Five Trends in Automated Test
Mike Santori, Technology and Business Fellow, National Instruments - Regional Keynote: Addressing the Challenge of Multicore Programming (Americas and Asia)
Jim St. Leger, Technical Marketing Manager, Intel
John Pasquarette, Director of Software Marketing, National Instruments - Regional Keynote: Ideal Test Systems for the Automotive Industry (Europe)
Matthias Krause, President, CGS Automotive, Inc
Time
Austin: 11:00 – 18:00 (GMT – 5)
London: 10:00 – 17:00 (GMT + 1)
Bangalore: 07:30 – 14:30 (GMT + 5.5)
Shanghai and Singapore: 10:00 – 17:00 (GMT + 8)
Sydney: 12:00 – 19:00 (GMT +10)
More info: National Instruments
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