The Global STC Conference (GSC) will be held on June 4th-6th in San Diego, California. This year theme is “Collaborative Solutions Beyond 2010.” The interactive global forum is open to both Semiconductor Test Consortium, Inc. (STC) member and non-members. The third annual GSC will focus on investigating collaborative solutions to address today’s most important test challenges.
Participants from around the world will see a wide-breadth of presentations hosted by luminaries representing leading companies and industry organizations, including those from integrated device manufacturers, electronic design automation firms, and outsourced semiconductor assembly and test companies. Face-to-face STC working group meetings will be scheduled before or after GSC, which are open to GSC attendees on the subjects of: docking and interface, portable test instrument module, probe card, yield enhancement analysis tools and university.
The Global STC Conference has formed a conference partnership with the IEEE Semiconductor Wafer Test Workshop (SW Test) and the Design Automation Conference (DAC). Both conferences run the week following GSC and will, like GSC, focus on important challenges facing the global semiconductor industry.
The Global STC Conference will be held in the Hilton Hotel in San Diego Mission Valley, and will kickoff with a keynote speech by Puhakka after registration and lunch. Online registration is already available for those interested in attending.
Global STC Conference
Collaborative Solutions Beyond 2010
June 4 – 6, 2008
San Diego, CA, USA
Hilton Hotel, San Diego Mission Valley
901 Camino Del Rio South
San Diego, CA 92108
More info: Global STC Conference