National Instruments Pan-European Automated Test Summit

National Instruments is hosting their Pan-European Automated Test Summit online. The event features technical sessions on identifying trends and overcoming new challenges in automated test. The Automated Test Summit is a free, full-day event that will take place on November 27th (9am – 5pm UK/GMT). During the summit, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area. The event will be available on demand for 30 days after the live event.

Technical tracks feature the following topics:

  • Design insights for creating reusable test systems
  • Lessons learned in test systems optimization
  • Cost-effective strategies for test system design
  • Techniques for maintaining system accuracy and availability
  • Tips for integrating disparate instrumentation platforms

The event will also explore the impact of new technologies, including:

  • PC technologies like Windows Vista and Intel multi-core processors
  • Instrumentation buses such as LAN/LXI, PXI and PXI Express, and USB

Representatives from companies such as Averna, Flextronics Sweden, Intel, Microsoft, National Instruments, and Texas Instruments will share their technical expertise and best practices during the event. In addition, NI Business and Technology Fellow Mike Santori will open the event with the keynote “Developing Next-Generation Test Systems,” and Marvin Landrum, automation infrastructure manager at Texas Instruments, will present the afternoon keynote “Strategies for Developing a Global Test Program.”

More info:
Automated Test Summit