Automated Test Summit

National Instruments
National Instruments is hosting their fourth annual Automated Test Summit. The online event features technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet May 8, and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area.

Representatives from companies such as Microsoft, Intel, Tektronix, Averna and BAE Systems will share their technical expertise and best practices during the event. NI Business and Technology Fellow Mike Santori will present the keynote “Developing Next-Generation Test Systems.” Marvin Landrum, automation infrastructure manager at Texas Instruments, will present the afternoon keynote “Strategies for Developing a Global Test Program.” Technical tracks feature the following topics:

  • Design insights for creating reusable test systems
  • Lessons learned in test systems optimization
  • Techniques for maintaining system accuracy and availability
  • Tips for integrating disparate instrumentation platforms
  • Reducing cost by migrating to a common test system architecture
  • Improving system performance with next-generation technologies
  • Strategies for developing a global test program
  • Best practices for incorporating new measurements into a test system

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