Stand Alone Windows Embedded CE 6.0 Test Kit

Posted by Ken Cheung in RTOS, Wireless on Tuesday, February 6, 2007
EDA News - 2007.02.06 »
« News - 2007.02.06 - Early Edition

Over on Mike Halls’ Embedded blog is an announcement on the availability of Windows Embedded CE 6.0 Test Kit as a stand alone download. Testers can now test devices and device images in development without the full Windows Embedded CE 6.0 product.

The Windows Embedded CE 6.0 Test Kit is a collection of tests and tools that can be used to help verify the stability, reliability, and quality of a platform or device running Windows Embedded CE 6.0. The download is intended to be used on systems where Platform Builder for Windows Embedded CE 6 is not installed; however, it is the same kit as the one included in the Windows Embedded CE 6 product and is used in the same way.

The following diagnostic tools are available in the kit:

  • Application Verifier: Memory leak detection tool
  • CPUMon: CPU monitoring tool
  • Stress: Device and OS stressing tool

free Electronic Products

Download Windows Embedded CE 6.0 Test Kit »

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