EDA Blog - electronic design automation, embedded systems, ic

News – 2006.10.25 – Early Edition

• VaST Systems to Present and Demonstrate Virtual System Prototyping
  VaST Systems—the technology leader in embedded design—will demonstrate virtual system prototyping solutions and speak at the 4th International System-on-Chip (SoC) Conference and Exhibition in Newport Beach, CA in November.
• OMRON Acquires Semiconductor Business Assets of Seiko Epson Subsidiary
  OMRON Corporation (TSE: 6645, NYSE: OMRNY), a global leader in automation, sensing and control technologies, announced that it has reached a preliminary agreement to acquire the semiconductor business assets of Seiko Epson’s consolidated subsidiary, Yasu Semiconductor Corporation.
• RTLinuxPro, RTCoreBSD RTOS Support Abatron BDM/JTAG Real-Time Debugging
  FSMLabs and Ultimate Solutions announced today that they are offering immediate support for use of Abatron BDI debugger on RTLinuxPro and RTCoreBSD real-time operating systems. “Our customers and developers have successfully used the BDI on Arm, Coldfire, PowerPC and other embedded processors and it works well with the tools we provide,” said FSMLabs CTO Cort Dougan.



• Sensata Rolls Out Automotive Humidity and Temperature Sensors
  With a focus on automotive safety, passenger comfort and fuel economy, Sensata Technologies, formerly the Sensors & Controls division of Texas Instruments, is introducing a family of capacitive humidity / temperature sensors for climate control and windshield anti-fogging systems. Built on proven ASIC technology from Sensata and an advanced thin-film polymer capacitive sensing element, this new line of humidity / temperature sensor has a response time five times faster with twice the initial accuracy of traditional resistive sensor technologies.
• Intellitech Supports Xilinx Virtex 4 RocketIO at-speed SERDES Tests
  Intellitech Corporation, the leader in lowering product costs through IEEE 1149.1/JTAG, has announced the support for Xilinx Virtex 4 RocketIO in its at-speed BERT-IP test module for Eclipse. BERT is an acronym for Bit Error Rate Test a well known industry metric in measuring high-speed link quality. The BERT-IP when used with Intellitech’s Eclipse JTAG tools is now capable of testing all combinations of Virtex 2 and Virtex 4 RocketIO interconnect at speeds up to six Gigabits per second.
• ICCAD Previews Nanotechnology Technical Track
  The International Conference on Computer Aided Design (ICCAD), the Electronic Design Automation (EDA) industry’s top technical conference, is now previewing its Nanotechnology Technical Track, which will provide by far the most comprehensive look at this emerging topic, including its leaders’ views and experience with an emphasis on its connection with design automation.

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