- Azimuth Systems Introduces AzCert Wi-Fi Certification Test Suite
Azimuth Systems Inc., the leading provider of Wi-Fi(R) engineering test equipment, today announced a solution that enables vendors to perform certification testing according to the new Wi-Fi Alliance Test Engine architecture. The AzCert(TM) Wi-Fi Certification Test Suite for Test Engine-enabled devices will be used by Wi-Fi Alliance Authorized Test Laboratories (ATLs) and allows product vendors, device manufacturers and semiconductor vendors to pre-test their Station Devices using the same approach.
- Magma, Virage Logic Develop Complete RTL-to-GDSII Flow
Magma(R) Design Automation, Inc. (Nasdaq:LAVA), a provider of semiconductor design software, and Virage Logic Corporation (Nasdaq:VIRL), a pioneer in Silicon Aware IP(TM) and leading provider of semiconductor intellectual property (IP) platforms, today announced a semiconductor design reference flow that will guide users through a proven methodology which includes insertion of design-for-test (DFT) elements through design, verification and layout. The flow details the techniques used to insert Virage Logic’s Self-Test and Repair (STAR) Memory System, scan insertion and use of automatic test pattern generation (ATPG) verification inside the Magma Blast Create(TM), Blast Fusion(R) and Blast Yield(TM) environments.
- Atmel’s ARM7 MCUs Support GByte-plus SDRAM, NAND Flash, CompactFlash
Atmel(R) Corporation (NASDAQ: ATML), has added three new microcontrollers to its SAM7 family of ARM7(TM)-based USB MCUs. Available in Flash memory densities of 32-, 256-, and 512-Kbytes, the SAM7SE microcontrollers are the only ARM7-based MCUs to include an external bus interface (EBI) that provides access to massive amounts of external NAND Flash, SDRAM, CompactFlash(R), SRAM and ROM storage. The ability to efficiently store and retrieve over a gigabyte of data makes SAM7SE MCUs ideal for data logging applications such as ambulatory medical monitoring.
- STMicroelectronics Licenses Samsung’s OneNAND Flash Memory
Samsung Electronics Co., Ltd., the leader in advanced semiconductor technology, today announced that STMicroelectronics, one of the world’s leading semiconductor manufacturers, has licensed Samsung’s most advanced flash memory, OneNAND(TM), to help meet rising demand in various applications, including the mobile marketplace.
- Synopsys, Virage Logic Release Embedded Memory Test Reference Design Flow
Synopsys, Inc. (Nasdaq: SNPS), a world leader in semiconductor design software, and Virage Logic Corporation (Nasdaq: VIRL), a pioneer in Silicon Aware IP(TM) and a leading provider of semiconductor intellectual property (IP) platforms, today announced initial availability of a test reference design flow for cost-effective testing and repair of embedded memories for system-on-chip (SoC) designs. The validated test design flow for 90-nanometer (nm) and 65-nm processes is based on the Synopsys Galaxy(TM) test platform and Virage Logic’s Self-Test and Repair (STAR) Memory System(TM).
- Mentor Graphics Automates Failure Diagnostics with YieldAssist
Mentor Graphics Corporation (Nasdaq: MENT) today announced that its YieldAssist(TM) tool now supports an automated, server-based use model for high volume diagnosis of wafer test failures. With the ability to quickly and accurately identify and isolate yield-limiting defects, the YieldAssist product represents a new era in the analysis of manufacturing failures, and enables a new source of yield learning. YieldAssist takes failure information directly from manufacturing scan test, and through advanced diagnostics, identifies failure causes.
- Mentor Rolls Out TestKompress 2007 for Automatic Test Program Generation
Mentor Graphics Corporation (Nasdaq: MENT) today announced the release of the TestKompress(R) 2007 software tool — an enhanced version of the ground-breaking tool that introduced scan test pattern compression to the marketplace. The TestKompress 2007 product offers significant improvements in the most important aspects of automatic test program generation (ATPG) – productivity, performance and test quality.